WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2016104965) LEARNING ASSESSMENT SERVICE SYSTEM
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/104965    International Application No.:    PCT/KR2015/012784
Publication Date: 30.06.2016 International Filing Date: 26.11.2015
IPC:
G06Q 50/20 (2012.01)
Applicants: O, Jong Hyeon [KR/KR]; (KR)
Inventors: O, Jong Hyeon; (KR).
HEO, Sang Hyung; (KR).
DO, Buyng Hak; (KR)
Agent: TW INTERNATIONAL PATENT AND LAW FIRM; 13F, 114, Yeoksam-ro Gangnam-gu Seoul 06252 (KR)
Priority Data:
10-2014-0186807 23.12.2014 KR
Title (EN) LEARNING ASSESSMENT SERVICE SYSTEM
(FR) SYSTÈME DE SERVICE D'ÉVALUATION D'APPRENTISSAGE
(KO) 학습 평가 서비스 시스템
Abstract: front page image
(EN)The present invention relates to a learning assessment service system, and provides a service system comprising: a question information database in which question information having identification tags input therein is stored; and an answer paper generation unit which, when examination paper information and question information are input, searches for questions having identification tags coinciding with the examination paper information and the question information, and generates an answer paper in which corresponding answer areas corresponding to the examination paper questions are arranged. Accordingly, the present invention enables an examiner and an examinee to efficiently and conveniently perform learning assessment regardless of time and place.
(FR)La présente invention concerne un système de service d'évaluation d'apprentissage, et fournit un système de service comprenant: une base de données d'informations d’interrogation dans laquelle des informations d’interrogation contenant des étiquettes d'identification sont stockées ; et une unité de génération de papier de réponse qui, lorsque des informations de papier d'examen et des informations d’interrogation sont entrées, recherche des questions dont des étiquettes d'identification coïncident avec les informations de papier d'examen et les informations d’interrogation, et génère un papier de réponse dans lequel des zones de réponse correspondantes correspondant aux questions de papier d'examen sont placées. La présente invention permet ainsi à un examinateur et à un candidat d'exécuter une évaluation d'apprentissage de manière efficace et pratique indépendamment d'un instant et d'un lieu.
(KO)본 발명은 학습 평가 서비스 시스템에 관한 것으로 식별 태그가 입력된 문제 정보가 저장된 문제 정보 데이터베이스 및 시험지 정보 및 문항 정보가 입력되면, 상기 시험지 정보 및 문항 정보와 일치하는 식별 태그를 가진 문제를 검색하여 해당하는 시험지 문제에 대응하는 답안 영역이 배치된 답안지를 생성하는 답안지 생성부를 포함하여 시간과 장소에 상관없이 출제자 및 응시자에게 효율적이고 편리하게 학습 평가가 가능한 서비스 시스템을 제공한다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)