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1. (WO2016100986) INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/100986    International Application No.:    PCT/US2015/067226
Publication Date: 23.06.2016 International Filing Date: 21.12.2015
IPC:
G01B 9/02 (2006.01), G01S 17/02 (2006.01), G01S 17/08 (2006.01)
Applicants: UNIVERSITY OF UTAH RESEARCH FOUNDATION [US/US]; 615 Arapeen Drive, Suite 310 Salt Lake City, Utah 84108 (US)
Inventors: WILLIAMS, Clayton C.; (US)
Agent: ALDER, Todd B.; (US)
Priority Data:
62/094,875 19.12.2014 US
Title (EN) INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
(FR) SYSTÈME D'INTERFÉROMÉTRIE ET PROCÉDÉS ASSOCIÉS
Abstract: front page image
(EN)Devices, systems, and methods for determining a distance between at least two points are disclosed and described, wherein interferometry technology is utilized to determine such distances.
(FR)L'invention concerne des dispositifs, des systèmes et des procédés pour déterminer une distance entre au moins deux points, la technologie d'interférométrie étant utilisée pour déterminer ces distances.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)