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1. (WO2016100755) METHODS OF ELEMENTAL IMAGING OF FORMATIONS AND SYSTEMS FOR PRODUCING THE SAME
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/100755    International Application No.:    PCT/US2015/066531
Publication Date: 23.06.2016 International Filing Date: 17.12.2015
IPC:
G01V 5/12 (2006.01), G01N 23/04 (2006.01), G01N 33/24 (2006.01), E21B 49/00 (2006.01)
Applicants: SCHLUMBERGER CANADA LIMITED [CA/CA]; 125 - 9 Avenue SE Calgary, Alberta T2G 0P6 (CA) (CA only).
SERVICES PETROLIERS SCHLUMBERGER [FR/FR]; 42 rue Saint Dominique 75007 Paris (FR) (FR only).
SCHLUMBERGER TECHNOLOGY B.V. [NL/NL]; Parkstraat 83-89m NL-2514 JG The Hague (NL) (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW only).
SCHLUMBERGER TECHNOLOGY CORPORATION [US/US]; 300 Schlumberger Drive, Sugar Land, Texas 77478 (US) (US only)
Inventors: XU, Libai; (US).
YANG, Wei; (US).
WANG, Jiaxin; (US)
Agent: BALLEW, Kimberly; (US)
Priority Data:
62/094,789 19.12.2014 US
Title (EN) METHODS OF ELEMENTAL IMAGING OF FORMATIONS AND SYSTEMS FOR PRODUCING THE SAME
(FR) PROCÉDÉS D'IMAGERIE ÉLÉMENTAIRE DE FORMATIONS ET SYSTÈMES DE PRODUCTION S'Y RAPPORTANT
Abstract: front page image
(EN)Methods of elemental imaging of a formation include acquiring spectral gamma ray measurement, acquiring a total gamma ray image, deriving structure information of the formation from the total gamma ray image, and applying the structure information to the spectral gamma ray measurement to form an elemental image. In the present methods, the structure information of the formation is derived from comparing the total gamma ray logs for each azimuthal sector to a derived total gamma ray log. The derived total gamma ray log is acquired from the total gamma ray image by summing over all azimuth bins or the spectral gamma ray measurement by summing over all energy bins.
(FR)L'invention concerne des procédés d'imagerie élémentaire d'une formation, comprenant l'acquisition de mesures spectrale de rayons gamma, l'acquisition d'une image des rayons gamma totaux, la déduction d'informations de structure de la formation à partir de l'image des rayons gamma totaux et l'application des informations de structure à la mesure spectrale des rayons gamma pour former une image élémentaire. Dans les procédés selon la présente invention, les informations de structure de la formation sont déduites de la comparaison des enregistrements des rayons gamma totaux pour chaque secteur azimutal à un enregistrement des rayons gamma totaux déduits. L'enregistrement des rayons gamma totaux déduits est acquis à partir de l'image des rayons gamma totaux par addition sur toutes les cases d'azimut ou de la mesure spectrale des rayons gamma par addition sur toutes les cases d'énergie.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)