WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2016099375) BEARING COMPONENT AND METHOD OF MANUFACTURE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/099375    International Application No.:    PCT/SE2015/051278
Publication Date: 23.06.2016 International Filing Date: 27.11.2015
IPC:
F16C 33/00 (2006.01)
Applicants: AKTIEBOLAGET SKF [SE/SE]; 415 50 Göteborg (SE)
Inventors: SJÖBLOM, Ulf; (SE).
KAMINSKI, Jacek; (SE).
HOSSEINI, Seyed; (SE)
Agent: GENTZEL, Marcus; (SE)
Priority Data:
1451555-5 16.12.2014 SE
Title (EN) BEARING COMPONENT AND METHOD OF MANUFACTURE
(FR) COMPOSANT DE PALIER ET PROCÉDÉ DE FABRICATION
Abstract: front page image
(EN)Bearing component (16,18,20,22) comprising unaffected material (14) having a surface that has been subjected to a hard machining process during which the temperature of said surface did not exceed the austenitizing temperature (24) of the unaffected material (14), whereby said surface of said bearing component (16,18,20,22) comprises a white layer (15) formed during said hard machining process, characterized in that said white layer (15) comprises a nano-crystalline microstructure comprising grains having a maximum grain size up to 500 nm and said white layer (15) is located directly adjacent to the unaffected material (14) of said bearing component (16,18,20,22), whereby no dark layer (12) is formed during said hard machining process.
(FR)La présente invention concerne un composant de palier (16, 18, 20, 22) comprenant un matériau non affecté (14) ayant une surface qui a été soumise à un processus d'usinage dur au cours duquel la température de ladite surface n'a pas dépassé la température d'austénitisation (24) du matériau non affecté (14), laquelle surface dudit composant de palier (16, 18, 20, 22) comprend une couche blanche (15) formée au cours dudit processus d'usinage dur, caractérisé en ce que ladite couche blanche (15) comprend une microstructure nanocristalline comprenant des grains ayant une dimension maximale des grains allant jusqu'à 500 nm et ladite couche blanche (15) est située de manière directement adjacente au matériau non affecté (14) dudit composant de palier (16, 18, 20, 22), de sorte qu'aucune couche sombre (12) n'est formée au cours dudit processus d'usinage dur.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)