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1. (WO2016088992) TEST APPARATUS AND CONTROL METHOD THEREOF
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2016/088992 International Application No.: PCT/KR2015/009819
Publication Date: 09.06.2016 International Filing Date: 18.09.2015
IPC:
G01N 21/78 (2006.01) ,G01N 21/27 (2006.01) ,G01N 21/59 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
75
Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
77
by observing the effect on a chemical indicator
78
producing a change of colour
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27
using photo-electric detection
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
59
Transmissivity
Applicants:
SAMSUNG ELECTRONICS CO., LTD. [KR/KR]; 129, Samsung-ro, Yeongtong-gu, Suwon-si Gyeonggi-do 16677, KR
Inventors:
YEO, Yeong Bae; KR
Agent:
SELIM INTELLECTUAL PROPERTY LAW FIRM; 10F and 11F, Taewoo Bldg. 285, Gangnam-daero Seocho-gu Seoul 06729, KR
Priority Data:
10-2014-017320504.12.2014KR
Title (EN) TEST APPARATUS AND CONTROL METHOD THEREOF
(FR) APPAREIL DE TEST ET SON PROCÉDÉ DE COMMANDE
Abstract:
(EN) A test apparatus and a control method thereof are provided. The test apparatus is configured to test a sample in a reactor. The test apparatus includes a light emitter configured to emit light to chambers of the reactor, a light receiver configured to receive light passed through the chambers while scanning the chambers, and a processor configured to determine a position or an area of a chamber among the chambers, based on light receiving positions of the light receiver, and respective intensities of the received light. The processor is further configured to measure an optical density of light passed through the determined position or the determined area of the chamber.
(FR) L'invention concerne un appareil de test et son procédé de commande. L'appareil de test est conçu pour tester un échantillon dans un réacteur. L'appareil de test comprend un émetteur de lumière conçu pour émettre de la lumière vers des chambres du réacteur, un récepteur de lumière conçu pour recevoir la lumière ayant traversé les chambres tout en balayant les chambres, et un processeur conçu pour déterminer une position ou une surface d'une chambre parmi les chambres, sur la base de positions de réception de lumière du récepteur de lumière, et des intensités respectives de la lumière reçue. Le processeur est en outre conçu pour mesurer une densité optique de la lumière étant passée par la position déterminée ou la surface déterminée de la chambre.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)