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Machine translation
1. (WO2016063569) SAMPLE ANALYSIS DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/063569    International Application No.:    PCT/JP2015/067492
Publication Date: 28.04.2016 International Filing Date: 17.06.2015
IPC:
G01N 21/59 (2006.01), G01N 21/27 (2006.01), G01N 35/00 (2006.01), G01N 37/00 (2006.01), G01N 21/07 (2006.01)
Applicants: SHARP KABUSHIKI KAISHA [JP/JP]; 1, Takumi-cho, Sakai-ku, Sakai City, Osaka 5908522 (JP)
Inventors: TSUNASAWA, Hiroshi; .
NAKAMURA, Atsushi; .
FUJITA, Hiroka;
Agent: HARAKENZO WORLD PATENT & TRADEMARK; Daiwa Minamimorimachi Building, 2-6, Tenjinbashi 2-chome Kita, Kita-ku, Osaka-shi, Osaka 5300041 (JP)
Priority Data:
2014-216621 23.10.2014 JP
Title (EN) SAMPLE ANALYSIS DEVICE
(FR) DISPOSITIF D'ANALYSE D'ÉCHANTILLON
(JA) 試料分析装置
Abstract: front page image
(EN)A sample analysis device (100) is provided with a chip (102) in which a reference chamber (414) accommodating a sample and a measurement chamber (404) accommodating a measurement liquid are formed on the same circumference of an axis of rotation (450) and with a measurement unit (109) for analyzing a component included in the sample on the basis of the amount of transmitted reference light that has passed through the reference chamber (414) and the amount of transmitted measurement light that has passed through the measurement chamber (404).
(FR)L'invention concerne un dispositif d'analyse d'échantillon (100) pourvu d'une puce (102) dans laquelle une chambre de référence (414) accueillant un échantillon et une chambre de mesure (404) accueillant un liquide de mesure sont formées sur la même circonférence d'un axe de rotation (450) et d'une unité de mesure (109) pour analyser un composant inclus dans l'échantillon sur la base de la quantité de lumière de référence transmise qui est passée à travers la chambre de référence (414) et de la quantité de lumière de mesure transmise qui est passée à travers la chambre de mesure (404).
(JA)試料分析装置(100)は、試料を収容した基準室(414)と、測定液を収容した測定室(404)とが回転軸(450)の周りに同一円周上に形成されたチップ(102)と、基準室(414)を透過した基準透過光量と、測定室(404)を透過した測定透過光量とに基づいて試料に含まれる成分を分析する計測部(109)とを備える。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)