Search International and National Patent Collections

1. (WO2016061975) METHOD AND DEVICE FOR DETERMINING ERROR VECTOR MAGNITUDE SERIES PARAMETER

Pub. No.:    WO/2016/061975    International Application No.:    PCT/CN2015/074046
Publication Date: Fri Apr 29 01:59:59 CEST 2016 International Filing Date: Thu Mar 12 00:59:59 CET 2015
IPC: H04B 10/07
Applicants: ZTE CORPORATION
中兴通讯股份有限公司
Inventors: SHEN, Bailin
沈百林
WU, Chengbin
武成宾
Title: METHOD AND DEVICE FOR DETERMINING ERROR VECTOR MAGNITUDE SERIES PARAMETER
Abstract:
Disclosed are a method and a device for determining an Error Vector Magnitude (EVM) series parameter. The method includes: acquiring a measurement signal; normalizing the measurement signal according to a power to obtain a normalized measurement signal; carrying out calculation according to the normalized measurement signal and an ideal signal to obtain an EVM; carrying out calculation according to the normalized measurement signal to obtain an IQ offset; eliminating the IQ offset to obtain an eliminated IQ offset measurement signal; carrying out calculation according to the eliminated IQ offset measurement signal to obtain an IQ gain imbalance; and carrying out calculation according to the eliminated IQ offset measurement signal to obtain a quadrature phase error.