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1. (WO2016060449) X-RAY PANORAMIC IMAGING APPARATUS
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/060449    International Application No.:    PCT/KR2015/010798
Publication Date: 21.04.2016 International Filing Date: 13.10.2015
IPC:
A61B 6/14 (2006.01)
Applicants: VATECH CO., LTD [KR/KR]; (Seoku-dong)13, Samsung 1-ro 2-gil Hwaseong-si Gyeonggi-do 445-170 (KR).
VATECH EWOO HOLDINGS CO., LTD [KR/KR]; (Seoku-dong)14, Samsung 1-ro 1-gil Hwaseong-si Gyeonggi-do 445-170 (KR)
Inventors: RO, Chang-Joon; (KR)
Agent: NEIT INTERNATIONAL PATENT AND LAW FIRM; 4F, Susan Bldg., 16, Teheran-ro 6-gil Gangnam-gu Seoul 135-080 (KR)
Priority Data:
10-2014-0137312 13.10.2014 KR
Title (EN) X-RAY PANORAMIC IMAGING APPARATUS
(FR) APPAREIL D'IMAGERIE PANORAMIQUE À RAYONS X
(KO) X선 파노라마 영상촬영장치
Abstract: front page image
(EN)The present invention relates to an X-ray panoramic imaging apparatus capable of acquiring more accurate X-ray panoramic images while minimizing the rotation of a rotation arm, the X-ray panoramic imaging apparatus comprising: at least one X-ray source for irradiating X-rays transmitting image layers within an arch section by section in the rear of the arch; an X-ray sensor for receiving, in the front of the arch, the X-rays that have transmitted the image layers within the arch section by section, wherein the at least one X-ray source is of a field emission type using an emitter of a nanostructure material.
(FR)L'invention concerne un appareil d'imagerie panoramique à rayons X susceptible d'acquérir des images panoramiques à rayons X plus précises, tout en minimisant la rotation d'un bras de rotation, l'appareil d'imagerie panoramique à rayons X comprenant : au moins une source de rayons X pour irradier des rayons X transmettant des couches d'image dans un arc section par section dans l'arrière de l'arc ; un capteur de rayons X destiné à recevoir, dans l'avant de l'arc, les rayons X qui ont transmis les couches d'image dans l'arc section par section, l'au moins une source de rayons X étant de type à émission de champ et utilisant un émetteur constitué d'un matériau à nanostructure.
(KO)본 발명은 회전암의 회전을 최소화하면서도 보다 정확한 X선 파노라마 영상을 획득할 수 있는 X선 파노라마 영상촬영장치로서, 악궁 후방에서 악궁 내 이미지 레이어를 구간별로 투과하는 X선을 조사하는 적어도 하나의 X선 소스; 상기 악궁 전방에서 상기 악궁 내 이미지 레이어를 구간별로 투과한 X선을 수광하는 X선 센서를 포함하고, 상기 적어도 하나의 X선 소스는 나노구조물질의 에미터를 사용한 전계방출방식인 X선 파노라마 영상촬영장치를 제공한다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)