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1. (WO2016056886) A SYSTEM AND METHOD FOR MEASURING A FLUORESCENCE EMISSION SIGNAL WITH PHASE CORRECTION IN PHASE FLUOROMETRIC
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2016/056886 International Application No.: PCT/MY2015/000082
Publication Date: 14.04.2016 International Filing Date: 07.10.2015
IPC:
G01N 21/64 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
Applicants: TENGKU AZHAR LONG SULAIMAN[MY/MY]; MY
MIMOS BERHAD[MY/MY]; Technology Park of Malaysia Bukit Jalil Kuala Lumpur, 57000, MY
Inventors: TENGKU AZHAR LONG SULAIMAN; MY
MOHAMAD YUSRI BIN MOHAMAD YUSOF; MY
ZHARFAN Hamdan; MY
Agent: MANIAM MAHALINGAM; IP Rights (M) SDN BHD No. 7-M, Biz Avenue, Neo Cyber, Lingkaran Cyber Point Barat, 63000 Cyberjaya Selangor, Darul Ehsan, MY
Priority Data:
PI 201400287809.10.2014MY
Title (EN) A SYSTEM AND METHOD FOR MEASURING A FLUORESCENCE EMISSION SIGNAL WITH PHASE CORRECTION IN PHASE FLUOROMETRIC
(FR) SYSTÈME ET PROCÉDÉ DE MESURE D’UN SIGNAL D’ÉMISSION DE FLUORESCENCE AVEC CORRECTION DE PHASE EN FLUOROMÉTRIE DE PHASE
Abstract:
(EN) The present invention relates to the sensing instruments and methods for measuring the phase measurement of an analyte more particularly, to a system and method for measuring a fluorescence emission signal with phase correction in phase fluorometric. One of the advantages of the present invention is that the system and method removes the effect of reflected excitation light source incident on the photodetector (216) and deriving accurate reference phase without using an optical filter or requiring matching excitation and reference/auxiliary light source modulation characteristics or matching light source driver electrical circuits. Another advantage of the system and method of the present invention is that it takes into account all components of system delays from light source drivers to the photodetector (216) output as compared to the conventional correction. Moreover, the system and method of the present invention is able to remove interfering component within the same frequency.
(FR) La présente invention porte sur les instruments de détection et les procédés de mesure de la mesure de phase d’un analyte, plus particulièrement sur un système et un procédé de mesure d’un signal d’émission de fluorescence avec correction de phase en fluorométrie de phase. Un des avantages de la présente invention consiste en ce que le système et le procédé annulent l’effet de source de lumière d’excitation réfléchie incidente sur le photodétecteur (216) et déduisent la phase de référence précise sans utiliser de filtre optique ni nécessiter de caractéristiques de modulation de sources de lumière d’excitation et de référence/auxiliaire ou de circuits électriques pilotes de sources de lumière correspondants. Un autre avantage du système et du procédé selon la présente invention consiste en ce qu’ils prennent en compte toutes les composantes de retards du système des pilotes de sources de lumière à la sortie du photodétecteur (216) par rapport à la correction traditionnelle. De plus, le système et le procédé selon la présente invention peuvent annuler la composante d’interférence dans la même fréquence.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)