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1. (WO2016053082) ELECTRONIC COMPONENT TEST APPARATUS
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2016/053082 International Application No.: PCT/MY2015/050113
Publication Date: 07.04.2016 International Filing Date: 30.09.2015
Chapter 2 Demand Filed: 17.05.2016
IPC:
G01R 31/28 (2006.01) ,H01H 31/02 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
H
ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
31
Air-break switches for high tension without arc-extinguishing or arc-preventing means
02
Details
Applicants: VISDYNAMICS RESEARCH SDN BHD[MY/MY]; Lot 3844, Jln TU 52, Kws Perindustrian Tasik Utama, Melaka, 75450, MY
Inventors: JONG, Pit Fong; MY
Agent: HEMINGWAY, Christopher Paul; MY
Priority Data:
PI201400283302.10.2014MY
Title (EN) ELECTRONIC COMPONENT TEST APPARATUS
(FR) APPAREIL DE TEST DE COMPOSANT ÉLECTRONIQUE
Abstract:
(EN) An apparatus for testing electronic components comprising a test module; an orientation module for delivering electronic components to the test module, at least one input module for feeding electronic components to the orientation module; at least one output module for receiving electronic components that are approved by the test module; and a reject module for receiving electronic components that are rejected by the test module; characterised in that one or more of the modules comprises an upper section connected to a lower section via interengagement means, the upper section being held to the lower section via a force provided by biasing means, the upper section being selectively detachable from the lower section by overcoming the force provided by the biasing means.
(FR) L'invention concerne un appareil pour tester des composants électroniques, comportant un module de test ; un module d'orientation pour amener des composants électroniques vers le module de test, au moins un module d'entrée pour acheminer des composants électroniques vers le module d'orientation ; au moins un module de sortie pour recevoir des composants électroniques qui sont approuvés par le module de test ; et un module de rejet pour recevoir des composants électroniques qui sont rejetés par le module de test ; caractérisé par le fait qu'un ou plusieurs des modules comprennent une section supérieure reliée à une section inférieure par l'intermédiaire de moyens de prise mutuelle, la section supérieure étant maintenue à la section inférieure par l'intermédiaire d'une force fournie par des moyens de sollicitation, la section supérieure étant sélectivement détachable de la section inférieure en surmontant la force fournie par les moyens de sollicitation.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)