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1. (WO2016052991) METHODS FOR ANALYZING SAMPLES
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/052991    International Application No.:    PCT/KR2015/010308
Publication Date: 07.04.2016 International Filing Date: 30.09.2015
IPC:
C12Q 1/68 (2006.01), G06F 19/18 (2011.01), G06F 19/20 (2011.01)
Applicants: SEEGENE, INC. [KR/KR]; 8FL., 9FL., 91, Ogeum-ro Songpa-gu Seoul 05548 (KR)
Inventors: CHUN, Jong Yoon; (KR).
LEE, Young Jo; (KR)
Agent: YANG, Boo Hyun; Suite 301, Chungdong Building, 1922, Nambusunhwan-ro Gwanak-gu Seoul 08793 (KR)
Priority Data:
10-2014-0132229 01.10.2014 KR
10-2014-0191924 29.12.2014 KR
10-2015-0051080 10.04.2015 KR
Title (EN) METHODS FOR ANALYZING SAMPLES
(FR) PROCÉDÉS D'ANALYSE D'ÉCHANTILLONS
Abstract: front page image
(EN)The present invention relates to a method for analyzing a sample. In particular, the present invention relates to a method for analyzing a sample and a method for correcting a raw data set of an amplification reaction. The present invention for analyzing a sample prevents from determining cycles based on false signals usually observed in a multitude of reactions and processes, thereby much more accurately obtaining information for analyzing a sample.
(FR)La présente invention concerne un procédé pour analyser un échantillon. En particulier, la présente invention concerne un procédé pour analyser un échantillon et un procédé permettant de corriger un ensemble de données brutes d'une réaction d'amplification. La présente invention pour l'analyse d'un échantillon empêche de déterminer des cycles sur la base de faux signaux généralement observés dans une multitude de réactions et de processus, ce qui permet d'obtenir des informations de manière beaucoup plus précise pour l'analyse d'un échantillon.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)