WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2016052646) INATTENTION MEASUREMENT DEVICE, SYSTEM, AND METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2016/052646 International Application No.: PCT/JP2015/077803
Publication Date: 07.04.2016 International Filing Date: 30.09.2015
Chapter 2 Demand Filed: 22.03.2016
IPC:
A61B 10/00 (2006.01)
Applicants: NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINE[JP/JP]; 20-1, Handayama 1-chome, Higashi-ku, Hamamatsu-shi, Shizuoka 4313192, JP
Inventors: MORI, Norio; JP
SUZUKI, Katsuaki; JP
TSUCHIYA, Kenji; JP
SHIMMURA, Chie; JP
Agent: NAGOYA INTERNATIONAL PATENT FIRM; Meishin Bldg., 20-19, Nishiki 1-chome, Naka-ku, Nagoya-shi, Aichi 4600003, JP
Priority Data:
2014-20102930.09.2014JP
Title (EN) INATTENTION MEASUREMENT DEVICE, SYSTEM, AND METHOD
(FR) DISPOSITIF, SYSTÈME ET PROCÉDÉ DE MESURE DE L'INATTENTION
(JA) 不注意の測定装置、システム、及び方法
Abstract: front page image
(EN) An inattention measurement device, system, and method wherein an index value indicating the inattention level of a subject is calculated on the basis of information relating to a history of fixation points of the subject when presented with the task of searching for a prescribed target stimulus.
(FR) L'invention concerne un dispositif, un système et un procédé de mesure de l'inattention, une valeur d'indice indiquant le niveau d'inattention d'un sujet étant calculée sur la base d'informations relatives à un historique de points de fixation du sujet lorsqu'il est confronté à la tâche consistant à rechercher un stimulus cible prescrit.
(JA)  不注意の測定装置、システム及び方法は、所定の目標刺激を探索する課題を呈示したときの被験者の注視点の履歴に関する情報を元に、被験者の不注意レベルを示す指標値を算出する。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)