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1. (WO2015191084) INTEGRATED COMPUTATIONAL ELEMENT WITH MULTIPLE FREQUENCY SELECTIVE SURFACES
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2015/191084 International Application No.: PCT/US2014/042368
Publication Date: 17.12.2015 International Filing Date: 13.06.2014
IPC:
E21B 49/00 (2006.01) ,E21B 49/08 (2006.01) ,G01N 27/04 (2006.01) ,G01B 11/25 (2006.01) ,G01N 21/01 (2006.01)
E FIXED CONSTRUCTIONS
21
EARTH OR ROCK DRILLING; MINING
B
EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
49
Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
E FIXED CONSTRUCTIONS
21
EARTH OR ROCK DRILLING; MINING
B
EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
49
Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
08
Obtaining fluid samples or testing fluids, in boreholes or wells
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
02
by investigating impedance
04
by investigating resistance
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
25
by projecting a pattern, e.g. moiré fringes, on the object
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
Applicants:
HALLIBURTON ENERGY SERVICES, INC. [US/US]; 3000 N. Sam Houston Parkway E. Houston, Texas 77032-3219, US
Inventors:
GAO, Li; US
PELLETIER, Michael T.; US
PERKINS, David L.; US
Agent:
PARKER, Greg, H.; US
Priority Data:
Title (EN) INTEGRATED COMPUTATIONAL ELEMENT WITH MULTIPLE FREQUENCY SELECTIVE SURFACES
(FR) ÉLÉMENT DE CALCUL INTÉGRÉ À SURFACES MULTIPLES SÉLECTIVES EN FRÉQUENCE
Abstract:
(EN) An optical analysis tool includes an integrated computational element (ICE). The ICE includes a plurality of layers stacked along a first axis. Constitutive materials of the layers are electrically conductive and patterned with corresponding patterns. An arrangement of the patterns with respect to each other is related to a characteristic of a sample.
(FR) Outil d'analyse optique qui comprend un élément de calcul intégré (ICE). L'ICE comprend une pluralité de couches empilées le long d'un premier axe. Les matériaux constitutifs des couches sont électroconducteurs et des motifs correspondants ont été créés sur lesdites couches. Un agencement des motifs les uns par rapport aux autres est associé à une caractéristique d'un échantillon.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)