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1. WO2015133284 - SPECIMEN SUPPORT AND SCANNING PROBE MICROSCOPE

Publication Number WO/2015/133284
Publication Date 11.09.2015
International Application No. PCT/JP2015/054553
International Filing Date 19.02.2015
IPC
G01Q 30/20 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
20Sample handling devices or methods
G01Q 60/24 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
CPC
G01Q 30/14
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
12Fluid environment
14Liquid environment
G01Q 30/20
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
20Sample handling devices or methods
G01Q 60/24
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
Applicants
  • 一般財団法人生産技術研究奨励会 THE FOUNDATION FOR THE PROMOTION OF INDUSTRIAL SCIENCE [JP]/[JP]
Inventors
  • 西田 周平 NISHIDA Shuhei
  • 藤井 輝夫 FUJII Teruo
Agents
  • 青木 俊明 AOKI Toshiaki
Priority Data
2014-04482707.03.2014JP
Publication Language Japanese (ja)
Filing Language Japanese (JA)
Designated States
Title
(EN) SPECIMEN SUPPORT AND SCANNING PROBE MICROSCOPE
(FR) SUPPORT D'ÉCHANTILLON ET MICROSCOPE À SONDE DE BALAYAGE
(JA) 試料台及び走査型プローブ顕微鏡
Abstract
(EN) The purpose of the present invention is to make it possible to easily and efficiently observe a specimen contained in a fluid without using a filtration device that is separate from the scanning probe microscope by attaching a filter-holding part for holding a filter on the fluid cell of the specimen support. For said purpose, the specimen support (10) for holding a specimen that is the object for observation with the scanning probe microscope is provided with: a fluid cell (11) into which fluid containing the specimen is introduced; and a filter unit comprising a filter (15), which allows the passage of the fluid and to which at least some of the specimen adheres. The fluid cell (11) comprises a fluid introduction port. The filter unit comprises a fluid discharge port and is attached on one surface of the fluid cell (11).
(FR) La présente invention permet d'observer facilement et efficacement un échantillon contenu dans un fluide, sans l'aide d'un dispositif de filtration qui est séparé du microscope à sonde de balayage, par la fixation d'une partie de maintien de filtre servant à maintenir un filtre sur la cellule pour fluide du support d'échantillon. L'invention concerne donc un support d'échantillon (10) servant à maintenir un échantillon qui est l'objet de l'observation avec le microscope à sonde de balayage, le support d'échantillon comprenant : une cellule pour fluide (11) dans laquelle le fluide contenant l'échantillon est introduit ; et une unité de filtration comprenant un filtre (15) qui permet le passage du fluide et auquel au moins une partie de l'échantillon adhère. La cellule pour fluide (11) comprend un orifice d'introduction de fluide. L'unité de filtration comprend un orifice d'évacuation de fluide et est fixée sur une surface de la cellule pour fluide (11).
(JA)  フィルタを保持するフィルタ保持部を試料台の流体セルに取り付けることによって、走査型プローブ顕微鏡と別個の濾(ろ)過装置を使用することなく、流体に含有された試料を容易に、かつ、効率よく観察することができるようにする。そのため、走査型プローブ顕微鏡の観察対象となる試料を保持する試料台10であって、前記試料を含有する流体が導入される流体セル11と、前記流体の通過を許容するとともに前記試料の少なくとも一部が付着するフィルタ15を含むフィルタユニットとを備え、前記流体セル11は流体導入口を含み、前記フィルタユニットは、流体排出口を含み、前記流体セル11の一面に取り付けられる。
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