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1. (WO2015127394) SYSTEM FOR BEAUTY, COSMETIC, AND FASHION ANALYSIS
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2015/127394    International Application No.:    PCT/US2015/017155
Publication Date: 27.08.2015 International Filing Date: 23.02.2015
IPC:
G06K 9/46 (2006.01), G06K 9/66 (2006.01), G06T 7/40 (2006.01)
Applicants: NORTHEASTERN UNIVERSITY [US/US]; 360 Huntington Avenue Boston, MA 02115 (US)
Inventors: FU, Yun; (US).
WANG, Shuyang; (US)
Agent: HJORTH, Beverly, E.; Posternak Blankstein & Lund LLP 800 Boylston Street, Prudential Tower Boston, MA 02199 (US)
Priority Data:
61/943,439 23.02.2014 US
61/994,169 16.05.2014 US
Title (EN) SYSTEM FOR BEAUTY, COSMETIC, AND FASHION ANALYSIS
(FR) SYSTEME POUR L'ANALYSE DE LA BEAUTE, DE PRODUITS COSMETIQUES ET DE LA MODE
Abstract: front page image
(EN)A system and method are provided to detect, analyze and digitally remove makeup from an image of a face. An autoencoder-based framework is provided to extract attractiveness-aware features to perform an assessment of facial beauty.
(FR)La présente invention concerne un système et un procédé pour la détection, l'analyse et le démaquillage numérique à partir d'une image d'un visage. Un cadre à base d'auto-codeur est prévu pour l'extraction de caractéristiques à sensibilité esthétique pour effectuer une évaluation de beauté du visage.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)