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1. (WO2015126064) PLATE-SHAPED TESTING CONTACTOR FOR SEMICONDUCTOR TESTING SOCKET
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2015/126064 International Application No.: PCT/KR2015/000426
Publication Date: 27.08.2015 International Filing Date: 15.01.2015
IPC:
G01R 31/26 (2014.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26
Testing of individual semiconductor devices
Applicants: ISC CO.,LTD[KR/KR]; (Sangdaewon-dong) Geumgang Penterium IT Tower 6th, Galmachi-ro 215, Jungwon-gu, Seongnam-si Gyeonggi-do 462-901, KR
Inventors: KIM, Jong Won; KR
JEONG, Il Min; KR
KIM, Ki Min; KR
KIM, Jong Bok; KR
OH, Il Kyeung; KR
Agent: OH, Jong Hwan; KR
Priority Data:
10-2014-001871218.02.2014KR
Title (EN) PLATE-SHAPED TESTING CONTACTOR FOR SEMICONDUCTOR TESTING SOCKET
(FR) CONTACTEUR D'ESSAI EN FORME DE PLAQUE POUR PRISE D'ESSAI À SEMI-CONDUCTEURS
(KO) 반도체 검사용 소켓의 판형 검사용 콘택터
Abstract:
(EN) The present invention relates to a plate-shaped testing contactor for a semiconductor testing socket. A plurality of plate-shaped testing contactors are provided on a semiconductor testing socket, in order to test electric characteristics of a semiconductor device. The plate-shaped testing contactors electrically connect between a bump electrode of the semiconductor device and a pad of a test circuit board. To this end, a plate-shaped testing contactor comprises an upper plunger, a lower plunger, and a compression coil spring. The upper plunger has a body portion extending in the horizontal direction from both sides thereof and a guide portion formed as the extending part is rotated/bent so as to face the inner peripheral surface of a housing hole. Therefore, the plate-shaped testing contactor according to the present invention has the guide portion of the upper plunger formed in a circular shape as a whole such that, during a vertical movement inside the housing hole, the circular guide portion can prevent wearing of the housing hole and can improve the position precision and verticality.
(FR) La présente invention concerne un contacteur d'essai en forme de plaque destiné à une prise d'essai à semi-conducteurs. Une pluralité de contacteurs d'essai en forme de plaque sont prévus sur une prise d'essai à semi-conducteurs afin de tester les caractéristiques électriques d'un dispositif à semi-conducteurs. Les contacteurs d'essai en forme de plaque sont raccordés électriquement entre une électrode à bosse du dispositif à semi-conducteurs et une pastille d'une carte d'essai à circuit imprimé. À cet effet, un contacteur d'essai en forme de plaque comprend un plongeur supérieur, un plongeur inférieur et un ressort hélicoïdal de compression. Le plongeur supérieur présente une partie corps qui s'étend dans la direction horizontale depuis ses deux côtés et une partie de guidage formée en tant que partie d'extension est mise en rotation/courbée de manière à faire face à la surface périphérique interne d'un trou de logement. Par conséquent, le contacteur d'essai en forme de plaque selon la présente invention a sa partie de guidage du plongeur supérieur conçue selon une forme circulaire dans son ensemble, de sorte que, pendant un déplacement vertical à l'intérieur du trou de logement, la partie de guidage circulaire puisse empêcher l'usure du trou de logement et améliorer la précision de position et la verticalité.
(KO) 본 발명은 반도체 검사용 소켓의 판형 검사용 콘택터에 관한 것이다. 판형 검사용 콘택터는 반도체 디바이스의 전기적인 특성을 테스트하기 위하여, 반도체 검사용 소켓에 복수 개가 구비된다. 판형 검사용 콘택터는 반도체 디바이스의 범프 전극과 테스트 회로기판의 패드 사이를 전기적으로 연결시킨다. 이를 위해 판형 검사용 콘택터는 상부 플런저와 하부 플런저 및 압축 코일 스프링을 포함한다. 상부 플런저는 몸체부가 양측으로부터 수평 방향으로 연장되고, 연장된 부분이 하우징 홀의 내주면에 대향해서 회전 굴곡되어 형성하는 가이드부를 구비한다. 따라서 본 발명의 판형 검사용 콘택터는 상부 플런저의 가이드부가 전체적으로 원형으로 형성되므로, 하우징 홀의 내부에서 수직 이동 시, 원형의 가이드부에 의해 하우징 홀의 마모를 방지할 수 있으며, 위치 정밀도 및 수직성을 향상시킬 수 있다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)