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1. (WO2015125990) SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME

Pub. No.:    WO/2015/125990    International Application No.:    PCT/KR2014/001507
Publication Date: Fri Aug 28 01:59:59 CEST 2015 International Filing Date: Wed Feb 26 00:59:59 CET 2014
IPC: G11C 29/00
Applicants: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
연세대학교 산학협력단
Inventors: KANG, Sungho
강성호
PARK, Jaeseok
박재석
Title: SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME
Abstract:
The present invention relates to a semiconductor device and a method for testing the same, the semiconductor device comprising: a plurality of stacked semiconductor dies; a plurality of through-silicon vias for delivering signals between the plurality of semiconductor dies; at least one redundancy through-silicon via formed between the plurality of semiconductor dies; a first operation unit for calculating a first output value from input signals which are input to the plurality of through-silicon vias by means of a logical operation; a second operation unit for calculating a second output value from output signals which are output from the plurality of through-silicon vias by means of a logical operation; and a comparator for comparing the first output value and the second output value.