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1. (WO2015124075) REAL TIME IMAGING SPECTROMETER BASED ON DIFFERENTIAL STRUCTURE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2015/124075    International Application No.:    PCT/CN2015/072748
Publication Date: 27.08.2015 International Filing Date: 11.02.2015
IPC:
G01J 3/447 (2006.01)
Applicants: HARBIN INSTITUTE OF TECHNOLOGY [CN/CN]; No.92 West Da-Zhi Street, Nangang District Harbin, Heilongjiang 150001 (CN)
Inventors: JIN, Peng; (CN).
ZHU, Shuaishuai; (CN).
ZHANG, Yu; (CN).
LIN, Jie; (CN)
Agent: INTELLECPRO CHINA LIMITED; QI, Yonghong, Patent Division 11/F, Tower C, Five Buildings, 9 Chegongzhuang Dajie, Xicheng District Beijing 100044 (CN)
Priority Data:
201410053286.X 18.02.2014 CN
Title (EN) REAL TIME IMAGING SPECTROMETER BASED ON DIFFERENTIAL STRUCTURE
(FR) SPECTROMÈTRE D'IMAGERIE EN TEMPS RÉEL BASÉ SUR UNE STRUCTURE DIFFÉRENTIELLE
Abstract: front page image
(EN)A real-time imaging spectrometer based on differential structure is provided. A polarization beam splitter (5) is set to alter the conventional optical structure to the differential structure. Taking the difference between these two interferogram obtained by two branches of differential structure as the final interferogram and performing the required post-processing calculations produces the spectrum at each pixel. Common-mode error is intensively restrained due to the differential structure, and 50%of the optical loss is avoided because of casting off the generator.
(FR)La présente invention concerne un spectromètre d'imagerie en temps réel basé sur une structure différentielle. Un séparateur de faisceau de polarisation (5) est réglée pour modifier la structure optique classique en structure différentielle. En prenant la différence entre deux interférogramme obtenus par deux branches de la structure différentielle en tant qu'interférogramme final et en effectuant les calculs nécessaires de post-traitement, on obtient le spectre au niveau de chaque pixel. L'erreur de mode classique est énormément diminuée grâce à la structure différentielle, et 50 % de la perte optique sont évités en raison de l'abandon du générateur.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)