Search International and National Patent Collections

1. (WO2015120499) DEVICE FOR PROFILING A WORKPIECE ALONG A CONTOUR

Pub. No.:    WO/2015/120499    International Application No.:    PCT/AT2015/050042
Publication Date: Fri Aug 21 01:59:59 CEST 2015 International Filing Date: Sat Feb 07 00:59:59 CET 2015
IPC: B23D 1/00
B23D 1/08
B23D 1/26
B23D 13/00
B23D 13/02
Applicants: GFM - GMBH
Inventors: HEIDLMAYER, Franz
Title: DEVICE FOR PROFILING A WORKPIECE ALONG A CONTOUR
Abstract:
The invention relates to a method for profiling a workpiece (2) along a contour (12) by means of a peeling blade (3), which peeling blade has at least one cutting edge (5) that determines the contour profile on a broad side (4) of the peeling blade and is guided along the contour (12) in an advancing motion in order to cut the contour profile. In order to create advantageous cutting conditions, the peeling blade (3) according to the invention is oriented with the broad side (4) of the peeling blade at an acute setting angle (a) in relation to a plane (14) perpendicular to the advancing direction (13) and is guided along the contour (12) while said setting angle (a) is maintained, wherein the cutting edge (5) of the peeling blade (3) extends along a projection of the desired contour profile in the advancing direction (13).