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1. (WO2015119541) CONFIGURABLE BUILT-IN SELF-TESTS OF DIGITAL LOGIC CIRCUITS
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2015/119541 International Application No.: PCT/SE2014/050146
Publication Date: 13.08.2015 International Filing Date: 05.02.2014
IPC:
G01R 31/3181 (2006.01) ,G01R 31/3183 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
3183
Generation of test inputs, e.g. test vectors, patterns or sequences
Applicants: TELEFONAKTIEBOLAGET LM ERICSSON (PUBL)[SE/SE]; SE-164 83 Stockholm, SE
Inventors: DUBROVA, Elena; SE
NÄSLUND, Mats; SE
CARLSSON, Gunnar; SE
SMEETS, Bernard; SE
Agent: EGRELIUS, Fredrik; Ericsson AB Patent Unit Kista DSM SE-16480 Stockholm, SE
Priority Data:
Title (EN) CONFIGURABLE BUILT-IN SELF-TESTS OF DIGITAL LOGIC CIRCUITS
(FR) AUTO-ESSAIS INTÉGRÉS CONFIGURABLES DE CIRCUITS LOGIQUES NUMÉRIQUES
Abstract:
(EN) An electronic device (300) comprising a digital logic circuit (101) and a test module (302) for testing the digital logic circuit is provided. The test module is adapted to generate test patterns based on a key and test parameters, apply the test patterns to the digital logic circuit, receive test responses from the digital logic circuit, compact the test responses into a test signature, and determine a test result (115) by comparing the test signature with an expected signature. The electronic device further comprises a writable storage means (311) for storing the key and the expected signature, and an interface (312) for writing the key and the expected signature to the writable storage means. Since the key and the expected signature are configurable after manufacturing, the provision of hardware Trojans during manufacturing is hampered, for the reason that an adversary does not have complete knowledge of the test patterns which will be generated during the lifetime of the electronic device.
(FR) La présente invention porte sur un dispositif électronique (300) qui comporte un circuit logique numérique (101) et un module d'essai (302) pour essayer le circuit logique numérique. Le module d'essai est conçu pour générer des motifs d'essai sur la base d'une clé et de paramètres d'essai, pour appliquer les motifs d'essai sur le circuit logique numérique, pour recevoir des réponses d'essai du circuit logique numérique, pour compresser les réponses d'essai en une signature d'essai et pour déterminer un résultat d'essai (115) par la comparaison de la signature d'essai à une signature attendue. Le dispositif électronique comporte en outre un moyen de mémoire inscriptible (311) devant mémoriser la clé et la signature attendue, et une interface (312) devant écrire la clé et la signature attendue sur le moyen de mémoire inscriptible. Étant donné que la clé et la signature attendue sont configurables après la fabrication, la fourniture de matériel cheval de Troie pendant la fabrication est entravée, un adversaire ne possédant pas de connaissance complète des motifs d'essai qui seront générés pendant la durée de vie du dispositif électronique.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)