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1. (WO2015119459) DEVICE AND METHOD FOR FORMING COUNTERFEITING PREVENTING PATTERN, AND DEVICE AND METHOD FOR DETECTING COUNTERFEITING PREVENTING PATTERN
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2015/119459 International Application No.: PCT/KR2015/001251
Publication Date: 13.08.2015 International Filing Date: 06.02.2015
IPC:
B23K 26/36 (2014.01) ,B42D 25/328 (2014.01) ,G07D 7/06 (2006.01)
B PERFORMING OPERATIONS; TRANSPORTING
23
MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
K
SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
26
Working by laser beam, e.g. welding, cutting, boring
36
Removing material
[IPC code unknown for B42D 25/328]
G PHYSICS
07
CHECKING-DEVICES
D
HANDLING OF COINS OR OF PAPER CURRENCY OR SIMILAR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
7
Testing specially adapted to determine the identity or genuineness of paper currency or similar valuable papers, e.g. for segregating those which are unacceptable or alien to a currency
06
using wave or particle radiation
Applicants:
한국기계연구원 KOREA INSTITUTE OF MACHINERY & MATERIALS [KR/KR]; 대전시 유성구 가정북로 156 156, Gajeongbuk-Ro, Yuseong-Gu, Daejeon 305-343, KR
Inventors:
노지환 NOH, Ji-Whan; KR
강희신 KANG, Hee-Shin; KR
손현기 SOHN, Hyon Kee; KR
김정오 KIM, Jeng-O; KR
Agent:
팬코리아특허법인 PANKOREA PATENT AND LAW FIRM; 서울시 강남구 논현로85길 70, 13F 13F, 70 Nonhyeon-ro 85-gil, Gangnam-gu, Seoul 135-080, KR
Priority Data:
10-2014-001424807.02.2014KR
10-2014-001425007.02.2014KR
10-2014-016913228.11.2014KR
10-2015-001814705.02.2015KR
10-2015-001814805.02.2015KR
Title (EN) DEVICE AND METHOD FOR FORMING COUNTERFEITING PREVENTING PATTERN, AND DEVICE AND METHOD FOR DETECTING COUNTERFEITING PREVENTING PATTERN
(FR) DISPOSITIF ET PROCÉDÉ DE FORMATION DE MOTIF EMPÊCHANT LA CONTREFAÇON ET DISPOSITIF ET PROCÉDÉ DE DÉTECTION DE MOTIF EMPÊCHANT LA CONTREFAÇON
(KO) 위조방지 패턴 생성 장치 및 그 방법, 위조방지 패턴 감지 장치 및 그 방법
Abstract:
(EN) The present invention provides: a device and method for forming a counterfeiting preventing pattern, which can produce a counterfeiting preventing pattern at a lower cost and more quickly by forming a nanometer or micrometer-scale fine pattern by using a laser processing system; and a device and method for detecting a micrometer or nanometer-scale counterfeiting preventing pattern by using a laser measuring system.
(FR) La présente invention concerne: un dispositif et un procédé de formation d'un motif empêchant la contrefaçon permettant de produire un motif empêchant la contrefaçon à moindres coûts et plus rapidement en formant un motif fin à l'échelle nanométrique ou micrométrique au moyen d'un système de traitement au laser; et un dispositif et un procédé de détection d'un motif empêchant la contrefaçon à l'échelle micrométrique ou nanométrique au moyen d'un système de mesure à l'aide d'un laser.
(KO) 본 발명은 레이저 가공시스템을 이용하여 나노미터 또는 마이크로미터 스케일의 미세 패턴을 형성함으로써 보다 적은 비용으로 보다 신속하게 위조방지 패턴을 가공할 수 있는 위조방지 패턴 생성 장치 및 그 방법과, 레이저 측정시스템을 이용하여 마이크로미터 또는 나노미터 스케일의 위조방지 패턴을 감지하는 장치 및 그 방법을 제공한다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)