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1. (WO2015118145) METHOD FOR CHARACTERIZING THE OPERATION OF A DIGITAL ELECTRONIC CIRCUIT AND DIGITAL ELECTRONIC CIRCUIT

Pub. No.:    WO/2015/118145    International Application No.:    PCT/EP2015/052614
Publication Date: Fri Aug 14 01:59:59 CEST 2015 International Filing Date: Tue Feb 10 00:59:59 CET 2015
IPC: G01R 31/30
G01R 31/317
G06F 17/50
Applicants: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
Inventors: MIRO PANADES, Ivan
Title: METHOD FOR CHARACTERIZING THE OPERATION OF A DIGITAL ELECTRONIC CIRCUIT AND DIGITAL ELECTRONIC CIRCUIT
Abstract:
The invention relates to a method for characterizing a digital circuit for determining an optimum operating point (A') of the digital circuit. The digital circuit comprises a plurality of sequential elements; conducting data paths between the sequential elements; a clock tree outputting a clock signal for timing the sequential elements; and a time fault sensor coupled to one of the sequential elements and having an input for receiving a data signal sent to the sequential element and configured to detect, during a detection window, a transition of the data signal; and means for setting first and second operating parameters of the digital circuit. The method comprises the following steps: a) activating a conducting data path leading to the sequential element coupled to the sensor; b) determining, for a given value of the first parameter (V1), a first value (Fd1) of the second parameter from which the sensor detects a transition of the data signal during the detection window, said values of the first (V1) and second (Fd1) parameters defining an operating point (A) of the digital circuit; c) correcting the operating point (A) by adding, to one of said values of the first and second parameters, a predetermined correction factor (ΔF1), which is a function of the operating point (A).