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1. (WO2015116185) PIXEL-BASED VISUALIZATION OF EVENT METRIC FLUCTUATION
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2015/116185    International Application No.:    PCT/US2014/014222
Publication Date: 06.08.2015 International Filing Date: 31.01.2014
IPC:
G06F 19/00 (2011.01)
Applicants: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP [US/US]; 11445 Compaq Center Drive West Houston, TX 77070 (US)
Inventors: HAO, Ming C.; (US).
ZHANG, Xin; (US).
COOK, Gregory W.; (US).
CHANG, Nelson L.; (US).
GHOSH, Riddhiman; (US).
HSU, Meichun; (US)
Agent: FERGUSON, Christopher Ward; Hewlett Packard Enterprise 3404 E. Harmony Road Mail Stop 79 Fort Collins, CO 80528 (US)
Priority Data:
Title (EN) PIXEL-BASED VISUALIZATION OF EVENT METRIC FLUCTUATION
(FR) VISUALISATION À BASE DE PIXELS DE FLUCTUATION MÉTRIQUE D'ÉVÉNEMENT
Abstract: front page image
(EN)According to an example, fluctuations of a metric for events are determined. The fluctuations are for multiple time intervals. A pixel-based visualization of the fluctuations is generated, and the pixels represent amounts of the fluctuations.
(FR)Selon un exemple, des fluctuations d'une métrique pour des événements sont déterminées. Les fluctuations sont destinées à plusieurs intervalles temporels. Une visualisation à base de pixels des fluctuations est générée, et les pixels représentent des quantités de fluctuations.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)