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1. (WO2015113607) TEST APPARATUS AND METHOD FOR TESTING A DEVICE UNDER TEST
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2015/113607 International Application No.: PCT/EP2014/051831
Publication Date: 06.08.2015 International Filing Date: 30.01.2014
IPC:
G01R 31/319 (2006.01)
Applicants: RIVOIR, Jochen[DE/DE]; DE (US)
ADVANTEST CORPORATION[JP/JP]; 1-32-1, Asahi-cho Nerima-ku Tokyo 179-0071, JP (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
Inventors: RIVOIR, Jochen; DE
Agent: BURGER, Markus; Schoppe, Zimmermann, Stöckeler, Zinkler, Schenk & Partner mbB Radlkoferstrasse 2 81373 München, DE
Priority Data:
Title (EN) TEST APPARATUS AND METHOD FOR TESTING A DEVICE UNDER TEST
(FR) APPAREIL D'ESSAI ET PROCÉDÉ POUR TESTER UN DISPOSITIF À L'ESSAI
Abstract: front page image
(EN) A test apparatus for testing a device under test is configured to receive a response signal from the device under test and to apply one or more correction functions to the received response signal to at least partially correct an imperfection of the DUT. The test apparatus is configured to thereby obtain a corrected response signal of the device under test and to evaluate the corrected response signal to judge the device under test.
(FR) L'invention concerne un appareil d'essai pour tester un dispositif à l'essai qui est configuré pour recevoir un signal de réponse à partir du dispositif à l'essai et pour appliquer une ou plusieurs fonctions de correction au signal de réponse reçu pour corriger au moins en partie une imperfection du dispositif à l'essai. L'appareil d'essai est configuré pour obtenir ainsi un signal de réponse corrigé du dispositif à l'essai et pour évaluer le signal de réponse corrigé afin de juger le dispositif à l'essai.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)