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1. (WO2015046682) DEVICE AND METHOD FOR GENERATING IDENTIFICATION KEY BY USING SEMICONDUCTOR PROCESS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2015/046682 International Application No.: PCT/KR2014/001320
Publication Date: 02.04.2015 International Filing Date: 19.02.2014
IPC:
G06F 21/73 (2013.01) ,G06F 21/70 (2013.01)
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
21
Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
70
Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
71
to assure secure computing or processing of information
73
by creating or determining hardware identification, e.g. serial numbers
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
21
Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
70
Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
Applicants:
(주) 아이씨티케이 ICTK CO., LTD. [KR/KR]; 경기도 성남시 분당구 판교로 323, 3층(삼평동, 투썬벤처포럼빌딩) (Twosoneventureforum Building, Sampyeong-dong) 3F., 323 Pangyo-ro Bundang-gu, Seongnam-si Gyeonggi-do 463-400, KR
Inventors:
최병덕 CHOI, Byong Deok; KR
김동규 KIM, Dong Kyue; KR
Agent:
특허법인 무한 MUHANN PATENT & LAW FIRM; 서울시 강남구 학동로 3길 9, 2층 (논현동, 명림빌딩) (Myeonglim Building, Nonhyeon-dong) 2th Floor, 9 Hakdong-ro 3-gil Gangnam-gu Seoul 135-814, KR
Priority Data:
10-2013-011642430.09.2013KR
Title (EN) DEVICE AND METHOD FOR GENERATING IDENTIFICATION KEY BY USING SEMICONDUCTOR PROCESS
(FR) DISPOSITIF ET PROCÉDÉ DE GÉNÉRATION DE CLÉ D'IDENTIFICATION AU MOYEN D'UN PROCESSUS À SEMI-CONDUCTEUR
(KO) 반도체 공정을 이용한 식별키 생성 장치 및 방법
Abstract:
(EN) Provided are a device and a method for generating an identification key by using process variation in a semiconductor process. A semiconductor is manufactured by adjusting the gate side edge position of a contact such that a difference between the probability that the gate of a transistor is short-circuited from a drain or a source by the contact and the probability that the gate is not short-circuited is less than or equal to a predetermined critical value. When the manufactured semiconductor does not have a separate process, whether there is a short-circuit between the gate and the drain or the source is stochastically generated by the process variation, whether there is a short-circuit through the reading unit is detected, and the identification key is provided.
(FR) L'invention concerne un dispositif et un procédé de génération de clé d'identification au moyen de variation de processus dans un processus à semi-conducteur. Un semi-conducteur est fabriqué par réglage de la position du bord côté grille d'un contact de sorte que la différence entre la probabilité que la grille d'un transistor soit court-circuitée depuis un drain ou une source par le contact et la probabilité que la grille ne soit pas court-circuitée est inférieure ou égale à une valeur critique prédéterminée. Quand le semi-conducteur fabriqué ne possède pas de processus distinct, il est déterminé de manière stochastique par la variation de processus s'il y a un court-circuit entre la grille et le drain ou la source , il est détecté s'il y a un court-cuit dans l'unité de lecture , et la clé d'identification est fournie.
(KO) 반도체 공정에서의 공정 편차를 이용하여 식별키를 생성하는 장치 및 방법이 제공된다. 컨택에 의해 트랜지스터의 게이트가 드레인 또는 소스와 단락되는 확률과 단락되지 않는 확률의 차이가 미리 지정된 임계값 이하가 되도록 컨택의 게이트 측 엣지의 위치를 조절하여 반도체를 제조한다. 제조되는 반도체에 별도의 프로세스가 없는 경우, 게이트와 드레인 또는 소스의 단락 여부는 공정 편차에 의해 확률적으로 발생하고, 독출부를 통해 단락여부를 식별하고 식별키를 제공한다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)
Also published as:
US20160239684EP3054396