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1. (WO2015045183) COLONY IMAGE INSPECTION PROGRAM, COLONY IMAGE INSPECTION METHOD, AND COLONY IMAGE INSPECTION DEVICE

Pub. No.:    WO/2015/045183    International Application No.:    PCT/JP2013/076625
Publication Date: Fri Apr 03 01:59:59 CEST 2015 International Filing Date: Tue Oct 01 01:59:59 CEST 2013
IPC: C12M 1/34
G06F 19/10
Applicants: FUJITSU LIMITED
富士通株式会社
Inventors: HAYASHI, Mimiko
林 未実子
MIYAZAKI, Akira
宮崎 あきら
MIYAJIMA, Sachiko
宮島 沙知子
SAGA, Susumu
嵯峨 晋
KAWANO, Kiyoshi
川野 清志
HIDAKA, Kouichi
日高 豪一
Title: COLONY IMAGE INSPECTION PROGRAM, COLONY IMAGE INSPECTION METHOD, AND COLONY IMAGE INSPECTION DEVICE
Abstract:
Provided is a colony image inspection device (10) that obtains an image of each of three or more petri dishes in which bacterial colonies of the same type are cultivated for the purpose of inspection. In addition, the colony image inspection device (10) calculates a degree of similarity between three or more acquired images. In addition, the colony image inspection device (10) selects two images that have the lowest degree of similarity from among three or more images. In addition, the colony image inspection device (10) outputs the two selected images as an image in which said two images are arranged side by side.