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1. (WO2015045012) COLONY INSPECTION PROGRAM, COLONY INSPECTION DEVICE, AND COLONY INSPECTION METHOD

Pub. No.:    WO/2015/045012    International Application No.:    PCT/JP2013/075778
Publication Date: Fri Apr 03 01:59:59 CEST 2015 International Filing Date: Wed Sep 25 01:59:59 CEST 2013
IPC: C12M 1/34
G01N 21/17
Applicants: FUJITSU LIMITED
富士通株式会社
Inventors: MIYAJIMA, Sachiko
宮島 沙知子
MIYAZAKI, Akira
宮崎 あきら
SAGA, Susumu
嵯峨 晋
HAYASHI, Mimiko
林 未実子
KAWANO, Kiyoshi
川野 清志
HIDAKA, Kouichi
日高 豪一
Title: COLONY INSPECTION PROGRAM, COLONY INSPECTION DEVICE, AND COLONY INSPECTION METHOD
Abstract:
An acquisition section (111) acquires counting data from each terminal device via an interface and stores same in a storage unit. A counting section (112) counts the number of colonies contained in a culture dish on the basis of the respective culture dish image that is stored as image data. The counting section (112) also calculates an image feature value for each culture dish image. A calculation section (113) calculates the degree of similarity between corresponding culture dish images on the basis of the image feature values for the respective culture dish images that are stored as image feature value data. An assessment section (114) assesses whether or not the inspected culture dish is contaminated with microbes on the basis of the difference in numbers of colonies between the culture dishes and the degree of similarity between the culture dish images. The assessment section (114) outputs an alarm when said assessment section determines that the inspected culture dish has been contaminated with microbes.