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1. (WO2015044205) METHOD AND APPARATUS FOR DETERMINING AN ACTUAL JUNCTION TEMPERATURE OF AN IGBT DEVICE

Pub. No.:    WO/2015/044205    International Application No.:    PCT/EP2014/070376
Publication Date: Fri Apr 03 01:59:59 CEST 2015 International Filing Date: Thu Sep 25 01:59:59 CEST 2014
IPC: G01K 7/01
Applicants: ABB TECHNOLOGY AG
Inventors: SUNDARAMOORTHY, Vinoth
BIANDA, Enea
BLOCH, Richard
NISTOR, Iulian
KNAPP, Gerold
Title: METHOD AND APPARATUS FOR DETERMINING AN ACTUAL JUNCTION TEMPERATURE OF AN IGBT DEVICE
Abstract:
The present invention relates to a method for determining an actual junction temperature (Tj) and/or an actual collector current (Ic) of an IGBT device (2), wherein the IGBT device (2) has a main emitter (EM) and an auxiliary emitter (EA), comprising the steps of: - measuring the characteristics of an emitter voltage drop (VEE') as a difference between a main emitter voltage (VE) at the main emitter (EM) and an auxiliary emitter voltage (VE') at the auxiliary emitter (EA) during a switching operation of the IGBT device (2); and - determining the junction temperature and/or the collector current (Ic) based on the characteristics of the emitter voltage drop (VEE').