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1. (WO2015043021) METHOD FOR MEASURING WIDTH OF COLOR FILTER UNIT AND METHOD FOR MANUFACTURING LIQUID CRYSTAL PANEL

Pub. No.:    WO/2015/043021    International Application No.:    PCT/CN2013/085586
Publication Date: Fri Apr 03 01:59:59 CEST 2015 International Filing Date: Tue Oct 22 01:59:59 CEST 2013
IPC: G02F 1/1335
G02F 1/1362
Applicants: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
深圳市华星光电技术有限公司
Inventors: YUAN, Jiwang
袁继旺
Title: METHOD FOR MEASURING WIDTH OF COLOR FILTER UNIT AND METHOD FOR MANUFACTURING LIQUID CRYSTAL PANEL
Abstract:
A method for measuring the width of a color filter unit (203R, 203G, 203B) comprises the steps: providing a lower glass substrate (20) provided with a thin film transistor (201) array; and preparing a color filter (203) and a measurement module (303) on the thin film transistor (201) array by using a photoetching process, the color filter (203) being located in an effective region (40) of a liquid crystal panel and comprising a red filter unit (203R), a green filter unit (203G) and a blue filter unit (203B), and the measurement module (303) being located outside the effective region (40) of the liquid crystal panel and having the width same as that of the color filter unit (203R, 203G, 203B). A method for manufacturing a liquid crystal panel. The width of the color filter unit (203R, 203G, 203B) is measured by using the foregoing method in a process of manufacturing the liquid crystal panel. The method can effectively control the width of the color filter unit manufactured during the manufacturing of the liquid crystal panel, and improve the quality of the liquid crystal panel.