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Machine translation
1. (WO2015040726) MEASUREMENT JIG
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2015/040726    International Application No.:    PCT/JP2013/075371
Publication Date: 26.03.2015 International Filing Date: 19.09.2013
IPC:
G01C 15/06 (2006.01)
Applicants: KOMATSU LTD. [JP/JP]; 2-3-6, Akasaka, Minato-ku, Tokyo 1078414 (JP)
Inventors: SEKI Masanobu; (JP)
Agent: KINOSHITA & ASSOCIATES; 3rd floor, Ogikubo TM building, 26-13, Ogikubo 5-chome, Suginami-ku, Tokyo 1670051 (JP)
Priority Data:
Title (EN) MEASUREMENT JIG
(FR) GABARIT DE MESURE
(JA) 測定治具
Abstract: front page image
(EN)A measurement jig (30) that is attached to a part to be attached to that is a blade edge (P) and is used together with a total station (TS) to measure the position of a measurement point (MP), wherein the measurement jig (30) is provided with a prism mirror (40) for reflecting projected light from the total station (TS) and an attachment member (60) for attaching the prism mirror (40) to the blade edge (P), and the mirror center (MC) of the prism mirror (40) and the measurement point (MP) coincide.
(FR)La présente invention concerne un gabarit de mesure (30) fixé à une partie à laquelle il est destiné à être fixé qui consiste en un bord de lame (P) et utilisé conjointement avec une station totale (TS) afin de mesurer la position d'un point de mesure (MP), ledit gabarit de mesure (30) étant doté d'un miroir à prisme (40) destiné à réfléchir la lumière projetée à partir de la station totale (TS) et d'un élément de fixation (60) destiné à fixer le miroir à prisme (40) au bord de lame (P), et le centre de miroir (MC) du miroir à prisme (40) et le point de mesure (MP) coïncidant.
(JA) 被取付部としての刃先(P)に取り付けられ、トータルステーション(TS)と共に計測点(MP)の位置計測に用いられる測定治具(30)であって、トータルステーション(TS)からの投射光を反射するプリズムミラー(40)と、プリズムミラー(40)を刃先(P)に取り付ける取付部材(60)とを備え、プリズムミラー(40)のミラー中心(MC)と計測点(MP)とが一致している。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)