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1. (WO2015031675) NANOPARTICLE ASSISTED SCANNING FOCUSING X-RAY FLUORESCENCE IMAGING AND ENHANCED TREATMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2015/031675    International Application No.:    PCT/US2014/053259
Publication Date: 05.03.2015 International Filing Date: 28.08.2014
IPC:
G01N 23/223 (2006.01)
Applicants: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA [US/US]; 1111 Franklin Street, 12th Floor Oakland, CA 94607-5200 (US)
Inventors: GUO, Ting; (US).
DAVIDSON, R., Andrew; (US)
Agent: HAO, Joe, C.; Kilpatrick Townsend & Stockton LLP Two Embarcadero Center, 8th Floor San Francisco, California 94111-3834 (US)
Priority Data:
61/871,257 28.08.2013 US
Title (EN) NANOPARTICLE ASSISTED SCANNING FOCUSING X-RAY FLUORESCENCE IMAGING AND ENHANCED TREATMENT
(FR) IMAGERIE PAR FLUORESCENCE X À FOCALISATION ET BALAYAGE ASSISTÉE PAR NANOPARTICULES ET TRAITEMENT AMÉLIORÉ
Abstract: front page image
(EN)The present disclosure provides systems and methods for providing irradiation energy, imaging, and detecting X-ray fluorescence from a volume in a sample. The present disclosure further relates to methods of increasing the delivery of irradiation energy to a target in a sample.
(FR)La présente invention concerne des systèmes et des procédés permettant de produire de l'énergie d'irradiation, de créer des images et de détecter la fluorescence X à partir d'un volume dans un échantillon. La présente invention concerne également des procédés permettant d'augmenter l'administration d'énergie d'irradiation à une cible dans un échantillon.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)