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1. (WO2014210204) SYSTEMS AND METHODS FOR MEASURING SPEECH SIGNAL QUALITY
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2014/210204    International Application No.:    PCT/US2014/044163
Publication Date: 31.12.2014 International Filing Date: 25.06.2014
Chapter 2 Demand Filed:    24.04.2015    
IPC:
G10L 25/69 (2013.01)
Applicants: QUALCOMM INCORPORATED [US/US]; Attn: International IP Administration 5775 Morehouse Drive San Diego, California 92121 (US)
Inventors: SEN, Dipanjan; (US).
LU, Wenliang; (US)
Agent: AUSTIN, Wesley L.; (US)
Priority Data:
61/839,807 26.06.2013 US
61/839,796 26.06.2013 US
61/839,800 26.06.2013 US
61/876,177 10.09.2013 US
61/888,945 09.10.2013 US
14/314,019 24.06.2014 US
Title (EN) SYSTEMS AND METHODS FOR MEASURING SPEECH SIGNAL QUALITY
(FR) SYSTÈMES ET PROCÉDÉS POUR MESURER UNE QUALITÉ DE SIGNAL DE PAROLE
Abstract: front page image
(EN)A method for measuring speech signal quality by an electronic device is described. The method includes obtaining a modified single-channel speech signal. The method also includes estimating multiple objective distortions based on the modified single-channel speech signal. The multiple objective distortions include at least one foreground distortion and at least one background distortion. The method further includes estimating a foreground quality and a background quality based on the multiple objective distortions. The method additionally includes estimating an overall quality based on the foreground quality and the background quality.
(FR)L'invention concerne un procédé pour mesurer une qualité de signal de parole par un dispositif électronique. Le procédé consiste à obtenir un signal de parole à un seul canal modifié. Le procédé consiste également à estimer de multiples distorsions objectives sur la base du signal de parole à un seul canal modifié. Les multiples distorsions objectives comprennent au moins une distorsion de premier plan et au moins une distorsion d'arrière-plan. Le procédé consiste en outre à estimer une qualité de premier plan et une qualité d'arrière-plan sur la base des multiples distorsions objectives. Le procédé consiste en outre à estimer une qualité globale sur la base de la qualité de premier plan et de la qualité d'arrière-plan.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)