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1. (WO2014205576) SAMPLE PROCESSING IMPROVEMENTS FOR MICROSCOPY
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2014/205576 International Application No.: PCT/CA2014/050610
Publication Date: 31.12.2014 International Filing Date: 25.06.2014
IPC:
G02B 21/26 (2006.01) ,G01N 1/28 (2006.01) ,G01N 15/00 (2006.01) ,G01N 15/02 (2006.01) ,G01N 15/06 (2006.01) ,G01N 21/59 (2006.01) ,G01N 33/483 (2006.01) ,G01N 1/14 (2006.01)
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
24
Base structure
26
Stages; Adjusting means therefor
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
1
Sampling; Preparing specimens for investigation
28
Preparing specimens for investigation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
02
Investigating particle size or size distribution
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
06
Investigating concentration of particle suspensions
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
59
Transmissivity
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
33
Investigating or analysing materials by specific methods not covered by groups G01N1/-G01N31/131
48
Biological material, e.g. blood, urine; Haemocytometers
483
Physical analysis of biological material
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
1
Sampling; Preparing specimens for investigation
02
Devices for withdrawing samples
10
in the liquid or fluent state
14
Suction devices, e.g. pumps; Ejector devices
Applicants: ALENTIC MICROSCIENCE INC.[CA/CA]; 1344 Summer Street Halifax, Nova Scotia B3H 0A8, CA
Inventors: FINE, Alan Marc; CA
MACAULAY, Hershel; CA
HYMES-VANDERMEULEN, Noah; CA
Agent: SMART & BIGGAR; P.O. Box 2999, Station D 900 - 55 Metcalfe Street Ottawa, Ontario K1P 5Y6, CA
Priority Data:
61/839,73526.06.2013US
Title (EN) SAMPLE PROCESSING IMPROVEMENTS FOR MICROSCOPY
(FR) AMÉLIORATIONS DE TRAITEMENT D'ÉCHANTILLON DESTINÉES À LA MICROSCOPIE
Abstract:
(EN) Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.
(FR) L'invention concerne, entre autres, une première surface conçue pour recevoir un échantillon et devant être utilisée dans un dispositif de microscopie. Une seconde surface à déplacer dans une position prédéfinie par rapport à la première surface est prévue afin de former un espace d'échantillon qui se trouve entre la première et la seconde surface et contient au moins une partie de l'échantillon. Un mécanisme conçu pour déplacer la seconde surface d'une position initiale jusqu'à la position prédéfinie est prévu afin de former l'espace pour échantillon. Lorsque l'échantillon est en place sur la première surface, le mouvement de la seconde surface comprend une trajectoire qui n'est pas uniquement un mouvement linéaire de la seconde surface vers la première surface.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)