WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Options
Query Language
Stem
Sort by:
List Length
Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2014205402) SCRATCH TESTING APPARATUS AND METHODS OF USING SAME
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2014/205402 International Application No.: PCT/US2014/043498
Publication Date: 24.12.2014 International Filing Date: 20.06.2014
IPC:
G01N 19/06 (2006.01) ,G01N 3/56 (2006.01) ,G01N 3/46 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
19
Investigating materials by mechanical methods
06
Investigating by removing material, e.g. spark-testing
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3
Investigating strength properties of solid materials by application of mechanical stress
56
Investigating resistance to wear or abrasion
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3
Investigating strength properties of solid materials by application of mechanical stress
40
Investigating hardness or rebound hardness
42
by performing impressions under a steady load by indentors, e.g. sphere, pyramid
46
the indentors performing a scratching movement
Applicants: MASSACHUSETTS MATERIALS TECHNOLOGIES LLC[US/US]; 12 Gowell Lane Weston, Massachusetts 02493, US
Inventors: BELLEMARE, Simon Claude; US
NORMAND, Simon; US
PALKOVIC, Steven D.; US
Agent: MAEBIUS, Stephen B.; US
Priority Data:
61/837,72421.06.2013US
Title (EN) SCRATCH TESTING APPARATUS AND METHODS OF USING SAME
(FR) APPAREIL D'ESSAI DE RÉSISTANCE AU RAYAGE ET SES PROCÉDÉS D'UTILISATION
Abstract:
(EN) Provide in one embodiment is an apparatus, comprising an indentor wherein a tip thereof is configured to engage a sample surface, a surface-referencing device configured to establish the position of the indentor relative to the sample surface, a drive mechanism configured to move the indentor along the sample surface to form a scratch, and a measurement device configured to measure at least one of (i) a pile-up height of sample material removed from the scratch and (ii) a width of the scratch.
(FR) Selon un mode de réalisation, la présente invention se rapporte à un appareil, comprenant un poinçon dont une pointe est configurée pour entrer en contact avec une surface d'échantillon, un dispositif de référencement de surface configuré pour établir la position du poinçon par rapport à la surface d'échantillon, un mécanisme d'entraînement configuré pour déplacer le poinçon le long de la surface d'échantillon afin de former une rayure, et un dispositif de mesure configuré pour mesurer au moins une caractéristique parmi (i) une hauteur d'empilement de matériau d'échantillon retiré de la rayure et (ii) une largeur de la rayure.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)