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1. (WO2014200231) METHOD FOR COMPUTER-AIDED SIMULATION OF ATOMIC-RESOLUTION SCANNING SEEBECK MICROSCOPE IMAGE
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2014/200231 International Application No.: PCT/KR2014/005043
Publication Date: 18.12.2014 International Filing Date: 10.06.2014
IPC:
G01Q 30/04 (2010.01)
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
30
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
04
Display or data processing devices
Applicants:
한국과학기술원 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY [KR/KR]; 대전시 유성구 대학로 291 291, Daehak-ro Yuseong-gu Daejeon 305-701, KR
Inventors:
김용현 KIM, Yong Hyun; KR
여호기 LYEO, Ho Ki; KR
이의섭 LEE, Eui Sup; KR
Agent:
특허법인 무한 MUHANN PATENT & LAW FIRM; 서울시 강남구 학동로3길 9, 2층 (논현동, 명림빌딩) (Nonhyeon-dong, Myeonglim Building) 2th Floor, 9 Hakdong-ro 3-gil Gangnam-gu Seoul 135-814, KR
Priority Data:
10-2013-006602010.06.2013KR
10-2014-005561709.05.2014KR
Title (EN) METHOD FOR COMPUTER-AIDED SIMULATION OF ATOMIC-RESOLUTION SCANNING SEEBECK MICROSCOPE IMAGE
(FR) PROCÉDÉ DE SIMULATION ASSISTÉE PAR ORDINATEUR D'UNE IMAGE DE MICROSCOPE À BALAYAGE PAR EFFET SEEBECK À RÉSOLUTION ATOMIQUE
(KO) 원자수준-해상도 주사 제벡 현미경 이미지의 컴퓨터 원용 시뮬레이션 방법
Abstract:
(EN) The method for the computer-aided simulation of an atomic-resolution scanning Seebeck microscope image, according to an embodiment, relates to a simulation method in which a computer calculates a local thermoelectric voltage V(r) for the location r of a voltage probe so as to obtain a scanning Seebeck microscope image corresponding to the location r of the voltage prove.
(FR) Dans un mode de mise en oeuvre, ce procédé de simulation assistée par ordinateur d'une image de microscope à balayage par effet Seebeck à résolution atomique, se rapporte à un procédé de simulation dans lequel un ordinateur calcule une tension thermoélectrique locale V(r) pour la position r d'une sonde de tension de manière à obtenir une image de microscope à balayage par effet Seebeck correspondant à l'emplacement r de la sonde de tension.
(KO) 일 실시예에 따르면 원자수준-해상도(atomic-resolution) 주사 제벡 현미경 이미지(scanning seebeck microscope image)의 컴퓨터 원용 시뮬레이션 방법(compter-aided simulation method)으로서, 전압 탐침(voltage prove)의 위치 r에 대응하는 상기 주사 제벡 현미경 이미지를 획득하기 위해, 상기 전압 탐침의 위치 r에 대한 국지 열전 전압(local thermoelectric voltage; V(r))을 컴퓨터가 계산하는 시뮬레이션 방법에 관한 것이다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)