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1. (WO2014196363) SPECTROSCOPIC SYSTEM AND METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2014/196363    International Application No.:    PCT/JP2014/063501
Publication Date: 11.12.2014 International Filing Date: 21.05.2014
IPC:
G01N 21/35 (2014.01), G01N 21/359 (2014.01)
Applicants: KONICA MINOLTA, INC. [JP/JP]; 2-7-2, Marunouchi, Chiyoda-ku, Tokyo 1007015 (JP)
Inventors: HARADA, Koji; (JP).
ABE, Yoshihisa; (JP).
MIYA, Ryota; (JP)
Agent: KOTANI, Etsuji; Osaka Nakanoshima Building 2nd Floor, 2-2, Nakanoshima 2-chome, Kita-ku, Osaka-shi, Osaka 5300005 (JP)
Priority Data:
2013-121099 07.06.2013 JP
Title (EN) SPECTROSCOPIC SYSTEM AND METHOD
(FR) SYSTÈME ET PROCÉDÉ SPECTROSCOPIQUES
(JA) 分光分析システムおよび該方法
Abstract: front page image
(EN)According to this spectroscopic system and method, when determining, on the basis of measured spectra, content levels of components contained in a measured subject, the respective content levels of each of the plurality of components are divided into a plurality of intervals, and the measured spectrum and the standard spectrum are used to select, from among a plurality of calibration curves created on the basis of standard spectra appropriate to each of the intervals, which plurality of calibration curves have been classified according to the intervals, one or more calibration curves for calculating the content levels of the components contained in the measured subject.
(FR)L'invention porte sur un système et un procédé spectroscopiques permettant, lors de la détermination, sur la base de spectres mesurés, de niveaux de teneur de composants chez un sujet mesuré, de diviser les niveaux de teneur respectifs de chacun de la pluralité de composants en une pluralité d'intervalles et d'utiliser le spectre mesuré et le spectre étalon pour choisir, parmi une pluralité de courbes d'étalonnage créées sur la base de spectres étalons appropriés pour chacun des intervalles, lesquelles multiples courbes d'étalonnage ont été classées selon les intervalles, une ou plusieurs courbes d'étalonnage pour le calcul des niveaux de teneur des composants chez le sujet mesuré.
(JA) 本発明の分光分析システムおよび該方法では、測定対象スペクトルに基づいて測定対象物に含まれる成分の含有率を決定する際に、複数成分それぞれの含有率を複数の区間に分けて、各区間に応じた基準スペクトルに基づいて作成された複数の検量線であって、前記区間に応じて分類された前記複数の検量線、の中から、前記測定対象スペクトルと前記基準スペクトルとを用いて、前記測定対象物に含まれる前記成分の含有率を求めるための1つ以上の検量線が、選択される。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)