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1. (WO2014189570) COMPENSATING FOR A NON-IDEAL SURFACE OF A REFLECTOR IN A SATELLITE COMMUNICATION SYSTEM
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2014/189570    International Application No.:    PCT/US2014/016949
Publication Date: 27.11.2014 International Filing Date: 18.02.2014
IPC:
H01Q 3/26 (2006.01), H01Q 1/28 (2006.01), H01Q 15/14 (2006.01), H01Q 3/40 (2006.01), H01Q 5/00 (2015.01)
Applicants: THE BOEING COMPANY [US/US]; 100 North Riverside Plaza Chicago, Illinois 60606-2016 (US)
Inventors: KODURU, Chandra S.; (US).
SUH, Kihyun Kevin; (US).
VEYSOGLU, Murat E.; (US).
BUSCHE, Greg; (US)
Agent: ASSEFA, Brook; (US)
Priority Data:
13/798,342 13.03.2013 US
Title (EN) COMPENSATING FOR A NON-IDEAL SURFACE OF A REFLECTOR IN A SATELLITE COMMUNICATION SYSTEM
(FR) COMPENSATION D'UNE SURFACE NON IDÉALE D'UN RÉFLECTEUR DANS UN SYSTÈME DE TÉLÉCOMMUNICATION PAR SATELLITES
Abstract: front page image
(EN)A method is provided that includes measuring amplitudes and phases of signals reflected off a reflector of a satellite, with the amplitudes and phases forming a first set of measurements. The method includes calculating an element correlation matrix as a function of the first set of measurements. The element correlation matrix represents a radiated feed element pattern off the reflector. And the method includes adjusting a formed beam pattern of a beamformer based on the element correlation matrix to thereby compensate for a non-ideal surface of the reflector.
(FR)L'invention concerne un procédé qui consiste à mesurer des amplitudes et des phases de signaux réfléchis par un réflecteur d'un satellite, les amplitudes et phases formant un ensemble de mesures ; à calculer une matrice de corrélation d'éléments en fonction du premier ensemble de mesures, ladite matrice représentant un motif d'éléments d'alimentation rayonnés par le réflecteur ; et à régler le diagramme de faisceau formé d'un dispositif de formation de faisceaux, selon la matrice de corrélation d'éléments, afin de compenser une surface non idéale du réflecteur.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)