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Machine translation
1. (WO2014185676) METHOD FOR PERFORMING MEASUREMENT AND TERMINAL
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2014/185676    International Application No.:    PCT/KR2014/004231
Publication Date: 20.11.2014 International Filing Date: 12.05.2014
IPC:
H04B 7/26 (2006.01), H04B 17/00 (2006.01)
Applicants: LG ELECTRONICS INC. [KR/KR]; 128, Yeoui-daero, Yeongdeungpo-gu Seoul 150-721 (KR)
Inventors: YANG, Yoonoh; (KR).
LEE, Sangwook; (KR).
LIM, Suhwan; (KR).
JUNG, Manyoung; (KR).
HWANG, Jinyup; (KR)
Agent: S&IP PATENT & LAW FIRM; (2F. Samheung Yeoksam Bldg., Yeoksam-dong) 5 Teheran-ro 14-gil Gangnam-gu Seoul 135-080 (KR)
Priority Data:
61/822,414 12.05.2013 US
10-2014-0056647 12.05.2014 KR
Title (EN) METHOD FOR PERFORMING MEASUREMENT AND TERMINAL
(FR) PROCÉDÉ DE RÉALISATION DE MESURE ET TERMINAL
(KO) 측정 수행 방법 및 단말
Abstract: front page image
(EN)One disclosure of the present specification provides a method for performing a measurement. The method for performing the measurement comprises the steps of: receiving, from a serving cell, a first measurement subframe pattern for the serving cell and support information on a cell-specific reference signal (CRS) of a first neighboring cell and a CRS of a second neighboring cell; and receiving, from the serving cell, a second measurement subframe pattern for the first and second neighboring cells. Here, both the serving cell and the first neighboring cell are aggressor cells against a victim cell which is the second neighboring cell, and the received second measurement subframe pattern may be set based on an almost blank subframe (ABS) pattern, when a CRS of the serving cell collides with the CRS of the second neighboring cell but the CRS of the first neighboring cell does not collide with the CRS of the second neighboring cell. The method may include a step for performing a measurement on the first and second neighboring cells based on the second measurement subframe pattern.
(FR)Un mode de réalisation de la présente invention concerne un procédé de réalisation d'une mesure. Le procédé de réalisation de la mesure comprend les étapes consistant à : recevoir, d'une cellule de desserte, un premier motif de sous-trame de mesure pour la cellule de desserte et des informations de support sur un signal de référence spécifique à la cellule (CRS) d'une première cellule voisine et un CRS d'une seconde cellule voisine ; et recevoir, de la cellule de desserte, un second motif de sous-trame de mesure pour les première et seconde cellules voisines. Ici, la cellule de desserte et la première cellule voisine sont des cellules agresseurs d'une cellule victime qui est la seconde cellule voisine, et le second motif de sous-trame de mesure peut être défini en fonction d'un motif de sous-trame presque vide (ABS), lorsqu'un CRS de la cellule de desserte entre en collision avec le CRS de la seconde cellule voisine mais le CRS de la première cellule voisine n'entre pas en collision avec le CRS de la seconde cellule voisine. Le procédé peut comprendre une étape consistant à réaliser une mesure sur les première et seconde cellules voisines en fonction du second motif de sous-trame de mesure.
(KO)본 명세서의 일 개시는 측정을 수행하는 방법을 제공한다. 상기 측정 수행 방법은 서빙 셀에 대한 제1 측정 서브프레임 패턴과 제1 및 제2 이웃 셀의 CRS(Cell-specific Reference Signal)에 대한 지원 정보를 상기 서빙셀로부터 수신하는 단계와; 상기 서빙셀로부터, 제1 및 제2 이웃 셀에 대한 제2 측정 서브프레임 패턴을 수신하는 단계를 포함할 수 있다. 여기서, 상기 서빙셀과 상기 제1 이웃셀 둘다는 상기 제2 이웃셀인 희생자 셀에 대한 공격자 셀들이고, 상기 서빙셀의 CRS는 상기 제2 이웃셀의 CRS와 충돌하나 상기 제1 이웃셀의 CRS는 상기 제2 이웃셀의 CRS와는 충돌하지 않는 경우, 상기 수신된 제2 측정 서브프레임 패턴은 ABS(almost blank subframe) 패턴에 기초하여 설정될 수 있다. 상기 방법은 상기 제2 측정 서브프레임 패턴에 기초하여, 상기 제1 및 제2 이웃셀에 대한 측정을 수행하는 단계를 포함할 수 있다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)