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1. (WO2014182932) METHODS OF TESTING FOR ALLERGEN SENSITIVITY
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2014/182932    International Application No.:    PCT/US2014/037347
Publication Date: 13.11.2014 International Filing Date: 08.05.2014
IPC:
A61M 35/00 (2006.01)
Applicants: THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY [US/US]; 1705 El Camino Real Palo Alto, California 94306-1106 (US)
Inventors: BUTTE, Manish J.; (US).
RAJADAS, Jayakumar; (US)
Agent: SHERWOOD, Pamela J.; Bozicevic, Field & Francis LLP 1900 University Avenue, Suite 200 East Palo Alto, California 94303 (US)
Priority Data:
61/821,112 08.05.2013 US
61/988,082 02.05.2014 US
Title (EN) METHODS OF TESTING FOR ALLERGEN SENSITIVITY
(FR) PROCÉDÉS DE TEST DE SENSIBILITÉ AUX ALLERGÈNES
Abstract: front page image
(EN)A method of testing for specificity and strength of an allergic reaction is performed by penetrating the skin of an individual with the microneedle array comprising a plurality of epitopes and determining the response of the skin to the allergens. The response can be measured with a thermal imaging device. Analysis, and optionally treatment, can be provided to the individual.
(FR)Cette invention concerne un procédé de test de spécificité et de force d'une réaction allergique effectué par pénétration d'une matrice de micro-aiguilles comprenant une pluralité d'épitopes dans la peau d'un individu, et détermination de la réponse de la peau aux allergènes. La réponse peut être mesurée à l'aide d'un dispositif d'imagerie thermique. Une analyse, et éventuellement un traitement, peuvent être proposés à l'individu.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)