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1. WO2014156906 - METHOD FOR EVALUATING OPTICAL CHARACTERISTICS OF TRANSPARENT SUBSTRATE, AND OPTICAL DEVICE

Publication Number WO/2014/156906
Publication Date 02.10.2014
International Application No. PCT/JP2014/057612
International Filing Date 19.03.2014
IPC
G01M 11/00 2006.01
GPHYSICS
01MEASURING; TESTING
MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
11Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
C03C 15/00 2006.01
CCHEMISTRY; METALLURGY
03GLASS; MINERAL OR SLAG WOOL
CCHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
15Surface treatment of glass, not in the form of fibres or filaments, by etching
C03C 17/22 2006.01
CCHEMISTRY; METALLURGY
03GLASS; MINERAL OR SLAG WOOL
CCHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
17Surface treatment of glass, e.g. of devitrified glass, not in the form of fibres or filaments, by coating
22with other inorganic material
C03C 19/00 2006.01
CCHEMISTRY; METALLURGY
03GLASS; MINERAL OR SLAG WOOL
CCHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
19Surface treatment of glass, not in the form of fibres or filaments, by mechanical means
G02B 1/11 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
1Optical elements characterised by the material of which they are made; Optical coatings for optical elements
10Optical coatings produced by application to, or surface treatment of, optical elements
11Anti-reflection coatings
G02F 1/1333 2006.01
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01for the control of the intensity, phase, polarisation or colour
13based on liquid crystals, e.g. single liquid crystal display cells
133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
1333Constructional arrangements
CPC
G01N 2021/8883
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
8883involving the calculation of gauges, generating models
G01N 2021/9513
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
9513Liquid crystal panels
G01N 21/4738
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
47Scattering, i.e. diffuse reflection
4738Diffuse reflection
G01N 21/59
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
59Transmissivity
G01N 21/8851
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
G01N 21/958
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
84Systems specially adapted for particular applications
88Investigating the presence of flaws or contamination
95characterised by the material or shape of the object to be examined
958Inspecting transparent materials ; or objects, e.g. windscreens
Applicants
  • 旭硝子株式会社 ASAHI GLASS COMPANY, LIMITED [JP]/[JP]
Inventors
  • 妹尾 具展 SENOO, Tomonobu
  • 小林 裕介 KOBAYASHI, Yusuke
  • 大神 聡司 OGAMI, Satoshi
Agents
  • 伊東 忠重 ITOH, Tadashige
Priority Data
2013-07337529.03.2013JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) METHOD FOR EVALUATING OPTICAL CHARACTERISTICS OF TRANSPARENT SUBSTRATE, AND OPTICAL DEVICE
(FR) PROCÉDÉ D'ÉVALUATION DE CARACTÉRISTIQUES OPTIQUES DE SUBSTRAT TRANSPARENT, ET DISPOSITIF OPTIQUE
(JA) 透明基体の光学特性の評価方法、光学装置
Abstract
(EN)
[Solution] A method for evaluating optical characteristics of a transparent substrate that is laid out on the display-surface side of a display device and has first and second surfaces. Said method is characterized in that optical characteristics of the transparent substrate are evaluated using two indices, namely a quantified resolution index for the transparent substrate and a quantified reflected-image diffuseness index.
(FR)
L'invention concerne un procédé d'évaluation de caractéristiques optiques d'un substrat transparent qui est extrait du côté surface d'affichage d'un dispositif d'affichage et qui possède des première et seconde surfaces. Ledit procédé est caractérisé en ce que des caractéristiques optiques du substrat transparent sont évaluées à l'aide de deux indices, à savoir un indice de résolution quantifié pour le substrat transparent et un indice de diffusivité d'image réfléchie quantifié.
(JA)
【解決手段】表示装置の表示面側に配置される、第1および第2の表面を有する透明基体の光学特性の評価方法であって、透明基体の定量化された解像度指標値、および定量化された反射像拡散性指標値の2つの指標値を用いて、前記透明基体の光学特性を評価することを特徴とする透明基体の光学特性の評価方法。
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