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1. WO2014111476 - LANGMUIR PROBE

Publication Number WO/2014/111476
Publication Date 24.07.2014
International Application No. PCT/EP2014/050824
International Filing Date 16.01.2014
IPC
H05H 1/00 2006.1
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY- CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
1Generating plasma; Handling plasma
B64G 1/10 2006.1
BPERFORMING OPERATIONS; TRANSPORTING
64AIRCRAFT; AVIATION; COSMONAUTICS
GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
1Cosmonautic vehicles
10Artificial satellites; Systems of such satellites; Interplanetary vehicles
B64G 1/52 2006.1
BPERFORMING OPERATIONS; TRANSPORTING
64AIRCRAFT; AVIATION; COSMONAUTICS
GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
1Cosmonautic vehicles
22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
52Protection, safety or emergency devices; Survival aids
CPC
B64G 1/66
BPERFORMING OPERATIONS; TRANSPORTING
64AIRCRAFT; AVIATION; COSMONAUTICS
GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
1Cosmonautic vehicles
22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
66Arrangements or adaptations of apparatus or instruments, not otherwise provided for
G01R 19/25
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
19Arrangements for measuring currents or voltages or for indicating presence or sign thereof
25using digital measurement techniques
H05H 1/0075
HELECTRICITY
05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
HPLASMA TECHNIQUE
1Generating plasma; Handling plasma
0006Investigating plasma, e.g. degree of ionisation (electron temperature)
0068by thermal means
0075Langmuir probes
Applicants
  • UNIVERSITETET I OSLO [NO]/[NO]
Inventors
  • PEDERSEN, Arne
  • BEKKENG, Tore André
  • TRONDSEN, Espen
  • MOEN, Jøran
Agents
  • TAYLOR, Adam
Priority Data
1300799.216.01.2013GB
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) LANGMUIR PROBE
(FR) SONDE DE LANGMUIR
Abstract
(EN) A method of determining payload potential comprises: receiving data on a first bias voltage and a resulting first collected current of a first needle of a multi-needle Langmuir probe; receiving data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe; assigning a value for the electron temperature in which the multi-needle Langmuir probe was operating; and using the current and voltage data, the assigned electron temperature value and Langmuir probe theory to calculate the platform potential of the multi-needle Langmuir probe.
(FR) L'invention porte sur un procédé de détermination de potentiel de charge utile qui comprend : la réception de données sur une première tension de polarisation et un premier courant collecté résultant d'une première aiguille d'une sonde de Langmuir multi-aiguille ; la réception de données sur une seconde tension de polarisation et un second courant collecté résultant d'une seconde aiguille de la sonde de Langmuir multi-aiguille ; l'affectation d'une valeur pour la température des électrons dans laquelle la sonde de Langmuir multi-aiguille fonctionnait ; et l'utilisation des données de courant et de tension, de la valeur de température des électrons affectée et d'une théorie de sonde de Langmuir pour calculer le potentiel de plateforme de la sonde de Langmuir multi-aiguille.
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