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1. (WO2013190991) SKIN EVALUATION METHOD AND SKIN EVALUATION DEVICE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2013/190991 International Application No.: PCT/JP2013/065447
Publication Date: 27.12.2013 International Filing Date: 04.06.2013
IPC:
G01N 21/17 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
Applicants:
富士フイルム株式会社 FUJIFILM CORPORATION [JP/JP]; 東京都港区西麻布2丁目26番30号 26-30, Nishiazabu 2-chome, Minato-ku, Tokyo 1068620, JP
Inventors:
吉田 那緒子 YOSHIDA Naoko; JP
黒岩 果林 KUROIWA Karin; JP
Agent:
渡辺 望稔 WATANABE Mochitoshi; 東京都千代田区岩本町2丁目3番3号 友泉岩本町ビル6階 Yusen Iwamoto-cho Bldg. 6F., 3-3, Iwamoto-cho 2-chome, Chiyoda-ku, Tokyo 1010032, JP
Priority Data:
2012-13710718.06.2012JP
2013-11233428.05.2013JP
Title (EN) SKIN EVALUATION METHOD AND SKIN EVALUATION DEVICE
(FR) PROCÉDÉ ET DISPOSITIF D'ÉVALUATION DE LA PEAU
(JA) 肌の評価方法および肌評価装置
Abstract:
(EN) A profile is created on the basis of an interference signal obtained by optical coherence tomography, the profile having optical reflectance in relation to depth in a depth range that extends from the epidermis to the dermal upper layer. The difference between a reflectance (R1) at a minimum point (P1) and a reflectance (R2) at a maximum point (P2) is calculated from the created profile to obtain an evaluation index. The state of skin is evaluated on the basis of the evaluation index.
(FR) L'invention a pour objet de créer un profil sur la base d'un signal d'interférence obtenu par tomographie à cohérence optique, le profil représentant un facteur de réflexion optique en fonction de la profondeur dans une plage de profondeur qui s'étend de l'épiderme à la couche supérieure du derme. La différence entre un facteur de réflexion (R1) en un point de minimum (P1) et un facteur de réflexion (R2) en un point de maximum (P2) est calculée à partir du profil créé pour obtenir un indice d'évaluation. L'état de la peau est évalué sur la base de l'indice d'évaluation.
(JA)  光コヒーレンストモグラフィにより得られた干渉信号に基づいて、表皮から真皮の上層までの深さ範囲における深さに対する光の反射率のプロファイルを作成し、作成されたプロファイルから極小点P1における反射率R1と第2の極大点P2における反射率R2との差分を算出して評価指標とし、この評価指標に基づいて肌の状態を評価する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
CN104395727EP2863205KR1020150016966