Search International and National Patent Collections

1. (WO2013161835) LAYERED-BODY DETACHMENT-TESTING METHOD AND DETACHMENT-TESTING DEVICE

Pub. No.:    WO/2013/161835    International Application No.:    PCT/JP2013/061956
Publication Date: Fri Nov 01 00:59:59 CET 2013 International Filing Date: Wed Apr 24 01:59:59 CEST 2013
IPC: G01N 29/04
G01N 29/00
Applicants: NON-DESTRUCTIVE INSPECTION COMPANY LIMITED.
非破壊検査株式会社
MITSUBISHI KAKOKI KAISHA, LTD.
三菱化工機株式会社
Inventors: NAGAI, Tatsuyuki
永井 辰之
KITASAKA, Junichi
北阪 純一
ENDOH, Ken
遠藤 賢
Title: LAYERED-BODY DETACHMENT-TESTING METHOD AND DETACHMENT-TESTING DEVICE
Abstract:
Provided are a layered-body detachment-testing method and detachment-testing device which are capable of easily and clearly detecting interlayer detachment of a layered body. Multiple-reflected waves are received in advance in both a defect-free section and a simulated-detachment section of a layered body, and a number of reflections is obtained of reflected waves in which the difference between the echo height of the multiple-reflected wave in the defect-free section and the echo height of the multiple-reflected wave in the simulated-detachment section is at or above a prescribed level. The presence/absence of interlayer detachment is tested by receiving a multiple-reflected wave in a test site (E) of a layered body (10), and comparing the echo height of reflected waves for the number of reflections in the test site (E) to the echo height of reflected waves for the number of reflections in the defect-free section.