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1. (WO2013156769) A METHOD OF MEASUREMENT ON A MACHINE TOOL AND CORRESPONDING MACHINE TOOL APPARATUS
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2013/156769 International Application No.: PCT/GB2013/050968
Publication Date: 24.10.2013 International Filing Date: 16.04.2013
IPC:
G01B 21/04 (2006.01) ,G05B 19/401 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
02
for measuring length, width, or thickness
04
by measuring coordinates of points
G PHYSICS
05
CONTROLLING; REGULATING
B
CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
19
Programme-control systems
02
electric
18
Numerical control (NC), i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
401
characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes
Applicants: RENISHAW PLC[GB/GB]; New Mills, Gloucestershire Wotton-under-Edge Gloucestershire GL12 8JR, GB
Inventors: WOOLDRIDGE, Michael; GB
MOORE, Paul; GB
OULD, John; GB
Agent: ROLFE, Edward; Patent Department New Mills, Gloucestershire Wotton-under-Edge Gloucestershire GL12 8JR, GB
Priority Data:
12250096.018.04.2012EP
61/720,29330.10.2012US
Title (EN) A METHOD OF MEASUREMENT ON A MACHINE TOOL AND CORRESPONDING MACHINE TOOL APPARATUS
(FR) PROCÉDÉ DE MESURE SUR UNE MACHINE-OUTIL ET APPAREIL DE MACHINE-OUTIL CORRESPONDANT
Abstract:
(EN) A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method comprises controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.
(FR) L'invention porte sur un procédé de balayage d'un objet à l'aide d'une sonde analogique montée sur une machine-outil, de façon à collecter des données de mesure balayées le long d'une ligne de mesure nominale sur la surface de l'objet, la sonde analogique ayant une plage de mesure préférée. Le procédé met en œuvre la commande de la sonde analogique et/ou de l'objet de façon à effectuer une opération de balayage en fonction d'une course de mouvement relatif, la course de mouvement relatif étant configurée de telle sorte que, sur la base de propriétés supposées de la surface de l'objet, la sonde analogique sera amenée à obtenir des données à l'intérieur de sa plage de mesure préférée, ainsi qu'à faire aller la sonde analogique à l'extérieur de sa plage de mesure préférée, le long de la ligne de mesure nominale sur la surface de l'objet.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)