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1. WO2013153697 - RFID TAG INSPECTION METHOD, AND INSPECTION DEVICE

Publication Number WO/2013/153697
Publication Date 17.10.2013
International Application No. PCT/JP2012/080493
International Filing Date 26.11.2012
IPC
G06K 17/00 2006.01
GPHYSICS
06COMPUTING; CALCULATING OR COUNTING
KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
17Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/-G06K15/168
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G06K 7/10019
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
7Methods or arrangements for sensing record carriers, ; e.g. for reading patterns;
10by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
10009sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves
10019resolving collision on the communication channels between simultaneously or concurrently interrogated record carriers.
G06K 7/10366
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
7Methods or arrangements for sensing record carriers, ; e.g. for reading patterns;
10by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
10009sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves
10366the interrogation device being adapted for miscellaneous applications
G06K 7/10465
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
7Methods or arrangements for sensing record carriers, ; e.g. for reading patterns;
10by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
10009sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves
10366the interrogation device being adapted for miscellaneous applications
10465the interrogation device being capable of self-diagnosis, e.g. in addition to or as part of the actual interrogation process
Applicants
  • 株式会社村田製作所 MURATA MANUFACTURING CO., LTD. [JP]/[JP]
Inventors
  • 向井 剛 MUKAI Tsuyoshi
  • 道海 雄也 DOKAI Yuya
Agents
  • 特許業務法人プロフィック特許事務所 PROFIC PC
Priority Data
2012-09235913.04.2012JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) RFID TAG INSPECTION METHOD, AND INSPECTION DEVICE
(FR) PROCÉDÉ D'INSPECTION D'ÉTIQUETTE D'IDENTIFICATION PAR RADIOFRÉQUENCE (RFID) ET DISPOSITIF D'INSPECTION
(JA) RFIDタグの検査方法及び検査装置
Abstract
(EN)
The purpose of the present invention is to be able to collectively inspect the quality of multiple RFID tags arranged on an assembled base. An RFID tag inspection method involving a step in which a measurement signal is sent at once from a reader-writer to multiple RFID tags arranged on an assembled base and for processing a wireless signal, a step in which the response waves from each of the RFID tags are collectively read by the reader-writer, and a step in which the quality of each RFID tag is determined on the basis of the number and strength of the reception signals read by the reader-writer.
(FR)
La présente invention vise à être apte à inspecter collectivement la qualité de multiples étiquettes d'identification par radiofréquence (RFID) agencées sur une base assemblée. Un procédé d'inspection d'étiquette RFID comprend une étape dans laquelle un signal de mesure est envoyé immédiatement d'un dispositif de lecture-écriture à de multiples étiquettes RFID agencées sur une base assemblée et pour traiter un signal sans fil, une étape dans laquelle les ondes de réponse provenant de chacune des étiquettes RFID sont lues collectivement par le dispositif de lecture-écriture, et une étape dans laquelle la qualité de chaque étiquette RFID est déterminée sur la base du nombre et de la puissance des signaux de réception lus par le dispositif de lecture-écriture.
(JA)
 集合基材上に配列された複数のRFIDタグに対して一括してその良否を検査可能とすること。 集合基材上に配列された無線信号を処理する複数のRFIDタグに対して、リーダライタから一斉に測定用信号を送信する工程と、前記RFIDタグそれぞれからの応答波をリーダライタにて一括して読み取る工程と、リーダライタで読み取った受信信号の強度及び個数に基づいて、前記RFIDタグそれぞれの良否を判定する工程と、を備えたRFIDタグの検査方法。
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