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1. WO2013127370 - METHOD AND SYSTEM FOR MEASURING OPTICAL ASYNCHRONOUS SAMPLED SIGNAL

Publication Number WO/2013/127370
Publication Date 06.09.2013
International Application No. PCT/CN2013/072093
International Filing Date 01.03.2013
IPC
G01J 3/28 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28Investigating the spectrum
G02F 1/35 2006.01
GPHYSICS
02OPTICS
FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
35Non-linear optics
H01S 3/10 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
3Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
CPC
G01J 1/10
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1Photometry, e.g. photographic exposure meter
10by comparison with reference light or electric value ; provisionally void
G01J 11/00
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
11Measuring the characteristics of individual optical pulses or of optical pulse trains
G01J 3/0224
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02Details
0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
0224using polarising or depolarising elements
G01J 3/0245
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02Details
0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
0245using an optical amplifier of light, e.g. doped fiber
G01J 3/10
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02Details
10Arrangements of light sources specially adapted for spectrometry or colorimetry
G01J 3/108
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02Details
10Arrangements of light sources specially adapted for spectrometry or colorimetry
108for measurement in the infra-red range
Applicants
  • 北京航空航天大学 BEIHANG UNIVERSITY [CN]/[CN]
Inventors
  • 郑铮 ZHENG, Zheng
  • 赵欣 ZHAO, Xin
  • 刘磊 LIU, Lei
  • 刘建胜 LIU, Jiansheng
Agents
  • 北京聿宏知识产权代理有限公司 YUHONG INTELLECTUAL PROPERTY LAW FIRM
Priority Data
201210052680.202.03.2012CN
201210052940.602.03.2012CN
201210137119.404.05.2012CN
201210137481.104.05.2012CN
201310062796.928.02.2013CN
Publication Language Chinese (ZH)
Filing Language Chinese (ZH)
Designated States
Title
(EN) METHOD AND SYSTEM FOR MEASURING OPTICAL ASYNCHRONOUS SAMPLED SIGNAL
(FR) PROCÉDÉ ET SYSTÈME DE MESURE D'UN SIGNAL OPTIQUE ASYNCHRONE ÉCHANTILLONNÉ
(ZH) 一种光异步采样信号测量的方法和系统
Abstract
(EN)
A method and a system for measuring an optical asynchronous sampled signal. The system for measuring an optical asynchronous sampled signal comprises a pulsed optical source capable of outputting two optical pulses with different recurrence frequencies, a signal optical path, a reference optical path, and a detection device. Since the optical asynchronous sampled signal can be measured by merely using one pulsed optical source, the complexity and cost of the system are reduced. A multi-frequency optical comb system using the pulsed optical source and a method for implementing the multi-frequency optical comb are further disclosed.
(FR)
La présente invention concerne un procédé et un système de mesure d'un signal optique asynchrone échantillonné. Le système de mesure d'un signal optique asynchrone échantillonné selon l'invention comprend une source optique pulsée capable de sortir deux impulsions optiques avec différentes fréquences de récurrence, un trajet optique pour signal, un trajet optique de référence et un dispositif de détection. Etant donné que le signal optique asynchrone échantillonné peut être mesuré en utilisant uniquement une source optique pulsée, la complexité et le coût du système sont réduits. L'invention concerne également un système à peigne optique multifréquence utilisant la source optique pulsée et un procédé d'utilisation du peigne optique multifréquence.
(ZH)
一种光异步采样信号测量的方法和系统。光异步采样信号测量的系统包括一个能够输出两个不同重复频率的光脉冲的脉冲光源、信号光路、参考光路和探测装置。由于只利用了一个脉冲光源就能实现光异步采样信号测量,降低了系统的复杂度和成本。还公开了使用该脉冲光源的多频光梳系统和实现多频光梳的方法。
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