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1. (WO2013122225) METHOD FOR IMAGING MASS ANALYSIS USING PHYSICAL VAPOR DEPOSITION OF PLATINUM NANOPARTICLES
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2013/122225 International Application No.: PCT/JP2013/053743
Publication Date: 22.08.2013 International Filing Date: 15.02.2013
IPC:
G01N 27/62 (2006.01) ,B82Y 5/00 (2011.01) ,B82Y 40/00 (2011.01) ,G01N 1/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
62
by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
Y
SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES
5
Nano-biotechnology or nano-medicine, e.g. protein engineering or drug delivery
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
Y
SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES
40
Manufacture or treatment of nano-structures
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
1
Sampling; Preparing specimens for investigation
28
Preparing specimens for investigation
Applicants: A SCHOOL CORPORATION KANSAI UNIVERSITY[JP/JP]; 3-35, Yamate-cho 3-chome, Suita-shi, Osaka 5648680, JP
NISSAN CHEMICAL INDUSTRIES, LTD.[JP/JP]; 7-1, Kanda-Nishiki-cho 3-chome, Chiyoda-ku, Tokyo 1010054, JP
Inventors: ARAKAWA, Ryuichi; JP
KAWASAKI, Hideya; JP
OZAWA, Tomoyuki; JP
Agent: SAEGUSA & PARTNERS; Kitahama TNK Building, 1-7-1, Doshomachi, Chuo-ku, Osaka-shi, Osaka 5410045, JP
Priority Data:
2012-03325817.02.2012JP
Title (EN) METHOD FOR IMAGING MASS ANALYSIS USING PHYSICAL VAPOR DEPOSITION OF PLATINUM NANOPARTICLES
(FR) PROCÉDÉ D'ANALYSE DE MASSE PAR IMAGERIE METTANT EN ŒUVRE UN DÉPÔT PHYSIQUE EN PHASE VAPEUR DE NANOPARTICULES DE PLATINE
(JA) 白金ナノ粒子の物理蒸着を用いたイメージング質量分析方法
Abstract:
(EN) The present invention provides an improved method for imaging mass analysis using a matrix to assist in ionizing a sample, wherein ionization efficiency is high, reductions in visible information and migration are minimized, interference peaks originating from the matrix are absent, and analysis can be performed at a high spatial resolution. The present invention provides a method for imaging mass analysis characterized by the use of a sample prepared by physical vapor deposition of platinum nanoparticles on the surface of a sample provided for imaging mass analysis.
(FR) L'invention concerne un procédé d'analyse de masse par imagerie mettant en œuvre une matrice destinée à favoriser l'ionisation d'un matériau étudié. Plus précisément, l'invention fournit un procédé d'analyse de masse par imagerie amélioré dans lequel l'efficacité d'ionisation est élevée, la diminution de migration ou d'information visuelle est limitée, il n'y a pas de pic d'interférence dérivé de la matrice, et un examen selon une résolution spatiale élevée est possible. Concrètement, l'invention fournit un procédé d'analyse de masse par imagerie qui est caractéristique en ce qu'est mis en œuvre un échantillon préparé par dépôt physique en phase vapeur de nanoparticules de platine à la surface d'un matériau étudié soumis à une analyse de masse par imagerie.
(JA)  本発明は、試料のイオン化支援のためのマトリックスを用いるイメージング質量分析方法であって、イオン化効率が高く、マイグレーションや視覚情報の低減が抑制されており、マトリックス由来の妨害ピークがなく、高い空間分解能で解析が可能な、改善されたイメージング質量分析方法を提供する。 本発明は、具体的には、イメージング質量分析に供する試料の表面に白金ナノ粒子を物理蒸着することによって調製されたサンプルを用いることを特徴とするイメージング質量分析方法を提供する。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)