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1. (WO2013121964) DEVICE AND METHOD FOR INSPECTING EXTERNAL APPEARANCE OF SUBSTRATE

Pub. No.:    WO/2013/121964    International Application No.:    PCT/JP2013/052840
Publication Date: Fri Aug 23 01:59:59 CEST 2013 International Filing Date: Fri Feb 08 00:59:59 CET 2013
IPC: H05K 13/08
G01N 21/956
H05K 13/04
Applicants: FUJI MACHINE MFG. CO., LTD.
富士機械製造株式会社
Inventors: AMANO Masashi
天野 雅史
OIKE Hiroshi
大池 博史
SUZUKI Ikuo
鈴木 郁夫
Title: DEVICE AND METHOD FOR INSPECTING EXTERNAL APPEARANCE OF SUBSTRATE
Abstract:
The purpose of the present invention is to provide a device and method for inspecting the external appearance of a substrate, in which the inspection criteria can be updated according to the state in which a component is mounted. The device (2) for inspecting the external appearance of a substrate is arranged, on the production line (1), downstream from upstream-side devices (3-5), and inspects the external appearance of the substrate (8) using a predetermined inspection criteria. When a variation factor, which may cause poor external appearance of the substrate (8), occurs in an upstream-side device (3-5), the device (2) for inspecting the external appearance of a substrate inspects the external appearance of the substrate (8) using an inspection criteria that has been updated on the basis of the variation factor.