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1. (WO2013121324) ACTIVE PROBE FOR NEAR-FIELD OPTICAL MICROSCOPY AND ITS MANUFACTURING PROCESS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2013/121324 International Application No.: PCT/IB2013/050986
Publication Date: 22.08.2013 International Filing Date: 06.02.2013
IPC:
G01Q 60/20 (2010.01) ,B82Y 35/00 (2011.01) ,B82Y 20/00 (2011.01)
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
18
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
20
Fluorescence
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
Y
SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES
35
Methods or apparatus for measurement or analysis of nano-structures
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
Y
SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES
20
Nano-optics, e.g. quantum optics or photonic crystals
Applicants:
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES [FR/FR]; 25 rue Leblanc Bâtiment "Le Ponant D" F-75015 Paris, FR
Inventors:
FIORINI, Céline; FR
CHARRA, Fabrice; FR
DOUILLARD, Ludovic; FR
Agent:
PRIORI, Enrico; Cabinet Ores 36 rue de St Pétersbourg F-75008 Paris, FR
Priority Data:
125149517.02.2012FR
Title (EN) ACTIVE PROBE FOR NEAR-FIELD OPTICAL MICROSCOPY AND ITS MANUFACTURING PROCESS
(FR) SONDE ACTIVE POUR MICROSCOPIE OPTIQUE EN CHAMP PROCHE ET SON PROCÉDÉ DE FABRICATION
Abstract:
(EN) The invention relates to an active probe for near-field optical microscopy, characterized in that it comprises a metal or metallized tip (PM) at the apex of which a nanoscale body (BP) is located, said body comprising a polymer matrix capable of, or containing a host (MH) capable of, emitting, under illumination, light (SH) at a wavelength different from that of the illumination. Process for manufacturing such a probe. .
(FR) Sonde active pour microscopie optique en champ proche, caractérisée en ce qu'elle comporte une pointe métallique ou métallisée (PM) à l'apex de laquelle se trouve un bloc de dimensions nanométriques (BP) comprenant une matrice en polymère susceptible, ou contenant un hôte (MH) susceptible d'émettre, sous éclairage, un rayonnement lumineux (SH) de longueur d'onde différente de celle d'éclairage. Procédé de fabrication d'une telle sonde.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: French (FR)
Filing Language: French (FR)
Also published as:
EP2815243US20160077127