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1. WO2013121324 - ACTIVE PROBE FOR NEAR-FIELD OPTICAL MICROSCOPY AND ITS MANUFACTURING PROCESS

Publication Number WO/2013/121324
Publication Date 22.08.2013
International Application No. PCT/IB2013/050986
International Filing Date 06.02.2013
IPC
G01Q 60/20 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
18SNOM or apparatus therefor, e.g. SNOM probes
20Fluorescence
B82Y 35/00 2011.1
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE  OR TREATMENT OF NANOSTRUCTURES
35Methods or apparatus for measurement or analysis of nanostructures
B82Y 20/00 2011.1
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE  OR TREATMENT OF NANOSTRUCTURES
20Nanooptics, e.g. quantum optics or photonic crystals
CPC
G01Q 60/20
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
20Fluorescence
G01Q 60/22
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
22Probes, their manufacture, or their related instrumentation, e.g. holders
Applicants
  • COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES [FR]/[FR]
Inventors
  • FIORINI, Céline
  • CHARRA, Fabrice
  • DOUILLARD, Ludovic
Agents
  • PRIORI, Enrico
Priority Data
125149517.02.2012FR
Publication Language French (fr)
Filing Language French (FR)
Designated States
Title
(EN) ACTIVE PROBE FOR NEAR-FIELD OPTICAL MICROSCOPY AND ITS MANUFACTURING PROCESS
(FR) SONDE ACTIVE POUR MICROSCOPIE OPTIQUE EN CHAMP PROCHE ET SON PROCÉDÉ DE FABRICATION
Abstract
(EN) The invention relates to an active probe for near-field optical microscopy, characterized in that it comprises a metal or metallized tip (PM) at the apex of which a nanoscale body (BP) is located, said body comprising a polymer matrix capable of, or containing a host (MH) capable of, emitting, under illumination, light (SH) at a wavelength different from that of the illumination. Process for manufacturing such a probe. .
(FR) Sonde active pour microscopie optique en champ proche, caractérisée en ce qu'elle comporte une pointe métallique ou métallisée (PM) à l'apex de laquelle se trouve un bloc de dimensions nanométriques (BP) comprenant une matrice en polymère susceptible, ou contenant un hôte (MH) susceptible d'émettre, sous éclairage, un rayonnement lumineux (SH) de longueur d'onde différente de celle d'éclairage. Procédé de fabrication d'une telle sonde.
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