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1. (WO2013119764) METHOD AND APPARATUS FOR MEASURING THE WAVEFRONT OF AN OPHTHALMIC DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2013/119764    International Application No.:    PCT/US2013/025077
Publication Date: 15.08.2013 International Filing Date: 07.02.2013
IPC:
G01M 11/02 (2006.01)
Applicants: JOHNSON & JOHNSON VISION CARE, INC. [US/US]; 7500 Centurion Parkway Jacksonville, Florida 32256 (US)
Inventors: WIDMAN, Michael F.; (US).
AGARWAL, Naveen; (US)
Agent: JOHNSON, Philip S.; Johnson & Johnson One Johnson & Johnson Plaza New Brunswick, New Jersey 08933 (US)
Priority Data:
61/597,338 10.02.2012 US
Title (EN) METHOD AND APPARATUS FOR MEASURING THE WAVEFRONT OF AN OPHTHALMIC DEVICE
(FR) PROCÉDÉ ET APPAREIL PERMETTANT DE MESURER LE FRONT D'ONDE D'UN DISPOSITIF OPHTALMIQUE
Abstract: front page image
(EN)This invention provides for a method and a wavefront measuring apparatus used to measure, in one or continuous measurements, one or more ophthalmic devices directly on a forming mandrel, in non-hydrated state and in a much faster way with high spatial resolution.
(FR)La présente invention concerne un procédé et un appareil permettant de mesurer le front d'onde utilisé pour mesurer, lors d'une mesure ou de plusieurs mesures continues, un ou plusieurs dispositifs ophtalmiques directement sur un mandrin de formation, dans un état non hydraté et beaucoup plus rapidement avec une résolution spatiale élevée.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)